Advanced transmission electron microscopy : imaging and diffraction in nanoscience

著者

• Zuo, Jian Min
• Spence, John C. H.

書誌事項

Advanced transmission electron microscopy : imaging and diffraction in nanoscience

Jian Min Zuo, John C. H. Spence

Springer, [2017] , , c2017

• : softcover

注記

Content Type: text (ncrcontent), Media Type: unmediated (ncrmedia), Carrier Type: volume (ncrcarrier)

Includes bibliographies and indexes

詳細情報

• NII書誌ID(NCID): BD13683976
• ISBN:
  • 9781493982493
• LCCN: 2016947937
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: New York
• ページ数/冊数: xxvi, 729 pages
• 大きさ: 24 cm
• 分類:
  • LCC : MLCM 2019/44529 (T)
• 件名:
  • LCSH : Transmission electron microscopy