{"@context":{"owl":"http://www.w3.org/2002/07/owl#","bibo":"http://purl.org/ontology/bibo/","foaf":"http://xmlns.com/foaf/0.1/","rdfs":"http://www.w3.org/2000/01/rdf-schema#","prism":"http://prismstandard.org/namespaces/basic/2.0/","cinii":"http://ci.nii.ac.jp/ns/1.0/","dc":"http://purl.org/dc/elements/1.1/","dcterms":"http://purl.org/dc/terms/"},"@id":"https://ci.nii.ac.jp/ncid/BD1368404X.json","@graph":[{"@id":"https://ci.nii.ac.jp/ncid/BD1368404X#entity","@type":"bibo:Book","foaf:isPrimaryTopicOf":{"@id":"https://ci.nii.ac.jp/ncid/BD1368404X.json"},"dc:title":[{"@value":"Papers from the Eighth International Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Techniques, 23-28 July 1995, Snowmass Resort, Snowmass Village, Colorado"}],"dc:creator":"sponsored by American Vacuum Society [and 5 others] ; special editors, Robert Hamers [and 3 others]","dc:publisher":[{"@value":"Published for the American Vacuum Society by the American Institute of Physics"}],"dcterms:extent":"pages 787-1571","cinii:size":"28 cm","dc:language":"eng","dc:date":"1996","cinii:ncid":"BD1368404X","cinii:ownerCount":"1","foaf:maker":[{"@id":"https://ci.nii.ac.jp/author/DA04420063#entity","@type":"foaf:Person","foaf:name":[{"@value":"International Conference on Scanning Tunneling Microscopy/Spectroscopy"}]},{"@id":"https://ci.nii.ac.jp/author/DA03926125#entity","@type":"foaf:Person","foaf:name":[{"@value":"American Vacuum Society"}]},{"@type":"foaf:Person","foaf:name":[{"@value":"Hamers, Robert John"}]}],"bibo:owner":[{"@id":"https://ci.nii.ac.jp/library/FA011780","@type":"foaf:Organization","foaf:name":"東京大学 理学図書館","rdfs:seeAlso":{"@id":"https://opac.dl.itc.u-tokyo.ac.jp/opac/opac_openurl/?ncid=BD1368404X"}}],"prism:publicationDate":["1996"],"cinii:note":["Content Type: text (ncrcontent), Media Type: unmediated (ncrmedia), Carrier Type: volume (ncrcarrier)","Includes index"],"dc:subject":["DC20:530.4/27"],"foaf:topic":[{"@id":"https://ci.nii.ac.jp/books/search?q=Surfaces+%28Physics%29+--+Optical+properties+--+Congresses","dc:title":"Surfaces (Physics) -- Optical properties -- Congresses"},{"@id":"https://ci.nii.ac.jp/books/search?q=Surface+chemistry+--+Congresses","dc:title":"Surface chemistry -- Congresses"},{"@id":"https://ci.nii.ac.jp/books/search?q=Scanning+tunneling+microscopy+--+Congresses","dc:title":"Scanning tunneling microscopy -- Congresses"},{"@id":"https://ci.nii.ac.jp/books/search?q=Tunneling+spectroscopy+--+Congresses","dc:title":"Tunneling spectroscopy -- Congresses"},{"@id":"https://ci.nii.ac.jp/books/search?q=Semiconductors+--+Surfaces+--+Congresses","dc:title":"Semiconductors -- Surfaces -- Congresses"}],"dcterms:hasPart":[{"@id":"urn:isbn:1563966077"}]}]}