Technology and measurement around the globe

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Technology and measurement around the globe

edited by Louis Tay, Sang Eun Woo, Tara Behrend

（Educational and psychological testing in a global context / editor, Neal Schmitt）

Cambridge University Press, 2024

  • : hardback

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Content Type: text (ncrcontent), Media Type: unmediated (ncrmedia), Carrier Type: volume (ncrcarrier)

Includes bibliographical references and index

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