51st International Symposium for Testing and Failure Analysis (ISTFA 2025), Pasadena, California, USA, 16-20 November 2025

著者

• International Symposium for Testing and Failure Analysis
• ASM International

書誌事項

51st International Symposium for Testing and Failure Analysis (ISTFA 2025), Pasadena, California, USA, 16-20 November 2025

ASM International, [2026] , Printed with permission by Curran Associates [manufacture], 2026 , , c2025

タイトル別名

ISTFA 2025 : proceedings from the 51st International Symposium for Testing and Failure Analysis Conference : November 16-20, 2025, Pasadena, California, USA

ISTFA2025

注記

Content Type: text (ncrcontent), Media Type: unmediated (ncrmedia), Carrier Type: volume (ncrcarrier)

Includes bibliographical references and author index

• NII書誌ID(NCID): BD18563122
• ISBN:
  • 9798331331573
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Materials Park, Ohio,Red Hook, NY
• ページ数/冊数: 623 pages
• 大きさ: 28 cm
• 分類:
  • DC23 : 621.381
• 件名:
  • LCSH : Electronics -- Materials -- Testing -- Congresses
  • LCSH : Electronic apparatus and appliances -- Testing -- Congresses