{"@context":{"owl":"http://www.w3.org/2002/07/owl#","bibo":"http://purl.org/ontology/bibo/","foaf":"http://xmlns.com/foaf/0.1/","rdfs":"http://www.w3.org/2000/01/rdf-schema#","prism":"http://prismstandard.org/namespaces/basic/2.0/","cinii":"http://ci.nii.ac.jp/ns/1.0/","dc":"http://purl.org/dc/elements/1.1/","dcterms":"http://purl.org/dc/terms/"},"@id":"https://ci.nii.ac.jp/ncid/BD18651503.json","@graph":[{"@id":"https://ci.nii.ac.jp/ncid/BD18651503#entity","@type":"bibo:Book","foaf:isPrimaryTopicOf":{"@id":"https://ci.nii.ac.jp/ncid/BD18651503.json"},"dc:title":[{"@value":"X線分析の進歩"},{"@value":"Xセン ブンセキ ノ シンポ","@language":"ja-hrkt"}],"dcterms:alternative":["Advances in x-ray chemical analysis, Japan"],"dc:creator":"日本分析化学会X線分析研究懇談会編","dc:publisher":[{"@value":"アグネ技術センター"}],"dcterms:extent":"345, 3, 5p","cinii:size":"26cm","dc:language":"jpn","dc:date":"2026","cinii:ncid":"BD18651503","cinii:ownerCount":"3","foaf:maker":[{"@id":"https://ci.nii.ac.jp/author/DA00018141#entity","@type":"foaf:Person","foaf:name":[{"@value":"日本分析化学会"},{"@value":"ニホン ブンセキ カガッカイ","@language":"ja-hrkt"}]},{"@id":"https://ci.nii.ac.jp/author/DA00425021#entity","@type":"foaf:Person","foaf:name":[{"@value":"日本分析化学会X線分析研究懇談会"},{"@value":"ニホン ブンセキ カガクカイ Xセン ブンセキ ケンキュウ コンダンカイ","@language":"ja-hrkt"}]}],"bibo:owner":[{"@id":"https://ci.nii.ac.jp/library/FA002870","@type":"foaf:Organization","foaf:name":"大阪大学 附属図書館 理工学図書館","rdfs:seeAlso":{"@id":"https://opac.library.osaka-u.ac.jp/opac/opac_openurl/?ncid=BD18651503"}},{"@id":"https://ci.nii.ac.jp/library/FA006102","@type":"foaf:Organization","foaf:name":"東京理科大学 神楽坂図書館","rdfs:seeAlso":{"@id":"https://jimkilisop1.admin.tus.ac.jp/webopac/ufirdi.do?ufi_target=ctlsrh&ncid=BD18651503"}},{"@id":"https://ci.nii.ac.jp/library/FA006678","@type":"foaf:Organization","foaf:name":"明治大学 図書館","rdfs:seeAlso":{"@id":"https://opac2018.lib.meiji.ac.jp/webopac/ufirdi.do?ufi_target=ctlsrh&ncid=BD18651503"}}],"prism:publicationDate":["2026.3"],"cinii:note":["表現種別: テキスト (ncrcontent), テキスト (ncrcontent), 機器種別: 機器不用 (ncrmedia), コンピュータ (ncrmedia), キャリア種別: 冊子 (ncrcarrier), コンピュータ・ディスク (ncrcarrier)"],"dc:subject":["NDC9:433.57","NDC10:433.57"],"foaf:topic":[{"@id":"https://ci.nii.ac.jp/books/search?q=%E3%82%A8%E3%83%83%E3%82%AF%E3%82%B9%E7%B7%9A%E5%88%86%E5%85%89%E5%88%86%E6%9E%90","dc:title":"エックス線分光分析"}],"dcterms:isPartOf":[{"@id":"https://ci.nii.ac.jp/ncid/BN00358633#entity","dc:title":"X線工業分析, 61集","@type":"bibo:Book"}],"dcterms:hasPart":[{"@id":"urn:isbn:9784867070222","dc:title":"57"}]}]}