CiNii Articles - Futagami Koji

1

Review of the Measurement of Trane Amounts Charge Using the Magnetically Levitated Electrode Ionization Chamber [in Japanese]

KAWAGUCHI Toshiro , FUTAGAMI Koji , ICHIKI Hirofumi

In order to measure the trace amounts electric charge which exists in the atmosphere, we have developed a device of differential type using two magnetically levitated electrode ionization chambers. Th …

IEEJ Transactions on Sensors and Micromachines 133(10), 286-291, 2013-10-01

J-STAGE References (16)
2

Space Charge Measurement from the Ceramic Materials by Low-level γ-ray Irradiation [in Japanese]

ICHIKI Hirofumi , HARUYAMA Motohide , HIGAKI Hidehiko , KORENAGA Kazuhito , ISHIBASHI Kenji , KAWAGUCHI Toshirou , FUTAGAMI Koji

Radioisotopes 61(9), 475-479, 2012-09-15

References (10) Cited by (1)
3

Characteristics of a Large-sized Magnetically Levitated Electrode Ionization Chamber and an Application to Environmental Radiation Measurement [in Japanese]

KAWAGUCHI Toshiro , FUTAGAMI Koji , MATOBA Masaru , ICHIKI Hirofumi , UTSUNOMIYA Yoshitomo

Radioisotopes 55(7), 361-369, 2006-07-15

References (8) Cited by (2)
4

Measuring ion in the atmosphere with magnetically levitated ionization chamber [in Japanese]

Ichiki Hirofumi , Futagami Koji , Kawaguchi Toshiro , Fukuda Ryu , Utsunomiya Yoshitomo , Korenaga Kazuhito

We developed the high sensitivity magnetically levitated ionization chamber and are measuring the amount of ion in the atmosphere with high precision. This system is used to detect the amount of ion e …

九州産業大学工学部研究報告 (43), 49-56, 2006

IR
5

TEM Observation of Lattice Defects in Si Generated by the Nitrogen Ion Implantation and by the Oxide Film [in Japanese]

Kihara Koutarou , Kuroki Masako , Fukumori Taichiro , Akashi Yoshito , Futagami Koji

Abstract ###The damage generated by nitrogen ion implantation into silicon wafer was recovered by ###heat treatment, and research of seeing the recovery process was done. Lattice defects at the ###edg …

Memoirs of the Faculty of Engineering, University of Miyazaki (35), 37-40, 2006

IR
6

Analysis of Lattice Distortion under Si Crystal Surface by X-ray Topography [in Japanese]

Aso Takayuki , Fukumori Taichiro , Kuroki Masako , Akashi Yoshito , Futagami Koji

Abstract ###The X-ray reflection topography under simultaneously stimulated total reflection is applied to ###analyze the lattice distortion just beneath the Si surface. ###Contrast change of the latt …

Memoirs of the Faculty of Engineering, University of Miyazaki (35), 31-35, 2006

IR
7

Surfaces Lattice Distortions in Silicon Implanted with Low-Energy Nitrogen Ions after Annealing [in Japanese]

Nagatomo Hideki , Fukumori Taichiro , Kuroki Masako , Akashi Yoshito , Futagami Koji

Czochralski-grown Si(100) wafers with a stripe of oxide film are implanted by N+ accelerated at 8keV and at 1.5keV to the dose of 1xl0(15)cm-2 . Lattice distortions produced by the implantation are ob …

Memoirs of the Faculty of Engineering, University of Miyazaki (35), 25-29, 2006

IR
8

Magnetically levitating equipment used for an automatically measuring system of low level radioactive rays(DEPARTMENT OF ELECTRICAL ENGINEERING) [in Japanese]

Ichiki Hirofumi , Futagami Koji , Kawaguchi Toshiro , Matoba Masaru , Fukuda Ryu , Utsunomiya Yoshitomo

An Ionization chamber has some superior characters. One of them can be detected γ-rays in spite of a simple equipment. So the chamber has been widely used for monitoring air pollution by radioactivity …

九州産業大学工学部研究報告 (42), 43-48, 2005

IR
9

J-2 Thermal recovery of photoquenching in SI-GaAs investigated by a photoacoustic spectoroscopy [in Japanese]

Kuroki Y. , Yasumoto K. , Ikari T. , Maeda K. , Futagami K.

Proceedings of Symposium on Ultrasonic Electronics 15(0), 291-292, 1994

J-STAGE
10

PB-24 Photoacoustic Spectra of Si wafers at liquid helium temperature [in Japanese]

Matsuyama H. , Ikari T. , Yokoyama H. , Futagami K.

Proceedings of Symposium on Ultrasonic Electronics 15(0), 209-210, 1994

J-STAGE
11

30p-L-4 Photo and thermal induced crystallization of amorphous Ge_<37>Se_<63> [in Japanese]

Maeda Kouji , Ura Kei , Yokoyama Hirosumi , Ikari Tetsuo , Futagami Koji

Meeting Abstracts of the Physical Society of Japan 49.2(0), 170, 1994

J-STAGE
12

Effects of thermal donor generation on electrical properties of boron doped CZ Si [in Japanese]

Kamimura Kazuto , Ikari Tetsuo , Yokoyama Hirosumi , Maeda Kouji , Futagami Koji

Bulletin of the Faculty of Engineering,Miyazaki University (38), p215-220, 1992-08
13

Photoacoustic spectra for impurity levels in p-Si at room temperature [in Japanese]

Higashi Koji , Miyazaki Kazuyuki , Ikari Tetsuo , Yokoyama Hirosumi , Maeda Kouji , Futagami Koji

Bulletin of the Faculty of Engineering,Miyazaki University (38), p209-214, 1992-08
14

PA26 Annealing Effect on The Photoacoustic Spectra of Si [in Japanese]

HIGASHI Kouji , IKARI Tetuo , YOKOYAMA Hirosumi , MAEDA Kouji , FUTAGAMI Kouji

Proceedings of Symposium on Ultrasonic Electronics 13(0), 83-84, 1992

J-STAGE
15

PA25 Spatial distribution of EL2 in GaAs wafer by the photoacoustic spectroscopy [in Japanese]

Fukuyama A. , Ikari T. , Maeda K. , Futagami K.

Proceedings of Symposium on Ultrasonic Electronics 13(0), 81-82, 1992

J-STAGE
16

X線異常透過法によるGaAsウエハ-の熱処理効果 [in Japanese]

福森太一朗 , 明石義人 , 二神光次

Bulletin of the Faculty of Engineering,Miyazaki University (37), p249-252, 1991-09
17

Crystallization Process of Amorphous Ni65Cr16P19 by continuous annealing [in Japanese]

八木章雄 [他] , 前田幸治 , 碇哲雄 , 横山宏有 , 二神光次

Bulletin of the Faculty of Engineering,Miyazaki University (37), p167-172, 1991-09
18

Photoacoustic Spectra in Molecular-Beam-Epitaxial Grown n-GaAs Layer [in Japanese]

横山宏有 [他] , 福山敦彦 , 碇哲雄 , 前田幸治 , 二神光次

Bulletin of the Faculty of Engineering,Miyazaki University (37), p157-160, 1991-09
19

A3 Near Infrared Photoacoustic Spectra of Deep Level in GaAs [in Japanese]

Fukuyama A. , Miyazaki M. , Maeda K. , Ikari T. , Futagami K.

Proceedings of Symposium on Ultrasonic Electronics 12(0), 5-6, 1991

J-STAGE
20

Thickness dependences of Photoacoustic Spectra for GaAs [in Japanese]

横山宏有 [他] , 前田幸治 , 碇哲雄 , 二神光次

Bulletin of the Faculty of Engineering,Miyazaki University (36), p309-312, 1990-09

二神光次 Futagami Koji

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二神光次 Futagami Koji

Articles:　 1-20 of 43