小西 聡 KONISHI Satoru

ID:9000005893666

ルネサス Renesas Technology Corp. (2004年 CiNii収録論文より)

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  • Optimization of Loop-shape of a Bonding Wire using Design of Experiments  [in Japanese]

    KAWANO Kenya , KONISHI Satoru , ENDO Tsuneo , IIZUKA Mamoru , MIURA Hideo

    A method for evaluating fatigue life of the bonding wires in semiconductor packages under a temperature cycling test was studied analytically using a finite element method based on design of experimen …

    The proceedings of the JSME annual meeting 2004.6(0), 49-50, 2004

    J-STAGE 

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