Fujiki Yoshibumi

ID:9000045648774

Institute of Physics, Kyoto Prefectural University of Medicine (1961年 CiNii収録論文より)

Search authors sharing the same name

Articles:  1-1 of 1

  • Anomalous diffusion at the interface of thin bimetallic films of Bi and Sb.  [in Japanese]

    Suganuma Ryoji , Yoshida Toshiho , Fujiki Yoshibumi

    The intermetallic diffusion was studied by electron and X-ray diffraction and electrical resistance measurement on vacuum deposited thin bimetallic films of Bi and Sb. The formation of triple-layer, w …

    Journal of the Physical Society of Japan 16(4), ????, 1961-04

Page Top