SUZUKI Ryouichi

ID:9000045938950

Department of Materials Science and Engineering, Kyushu University (1995年 CiNii収録論文より)

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  • Role of Vacancy-Type Defects during Structural Relaxation of Amorphous Si

    MOTOOKA Teruaki , HIROYAMA Yuichi , SUZUKI Ryouichi , OHDAIRA Toshiuki , HIRANO Yosiuki , SATO Fumio

    Structural relaxation processes in amorphous Si (a-Si) have been investigated using Raman spectroscopy and positron lifetime measurements. Bond angle deviation Δθ and sizes of vacancy-type d …

    Japanese Journal of Applied Physics 34(2), L149-L152, 1995-02-01

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