HIRANO Yosiuki


NHK Science and Technical Research Laboratories (1995年 CiNii収録論文より)

Search authors sharing the same name

Articles:  1-1 of 1

  • Role of Vacancy-Type Defects during Structural Relaxation of Amorphous Si

    MOTOOKA Teruaki , HIROYAMA Yuichi , SUZUKI Ryouichi , OHDAIRA Toshiuki , HIRANO Yosiuki , SATO Fumio

    Structural relaxation processes in amorphous Si (a-Si) have been investigated using Raman spectroscopy and positron lifetime measurements. Bond angle deviation Δθ and sizes of vacancy-type d …

    Japanese Journal of Applied Physics 34(2), L149-L152, 1995-02-01

    J-STAGE  References (12)

Page Top