MURAKI Takeshi

ID:9000045948826

Electrical Engineering, Hosei University (1994年 CiNii収録論文より)

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Articles:  1-1 of 1

  • Damage Formed by Si^+ Implantation in GaAs

    HARA Tohru , MURAKI Takeshi , TAKEDA Satoru , UCHITOMI Naotaka , KITAURA Yoshiaki , GAO Guang-bo

    Japanese journal of applied physics. Pt. 2, Letters 33(10B), L1435-L1437, 1994-10-15

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