Kabashima Shigeharu KABASHIMA Shigeharu

ID:9000046018195

Department of Applied Physics, Tokyo Institute of Technology (1976年 CiNii収録論文より)

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  • Critical Fluctuation near Threshold of Gunn Instability

    KABASHIMA Shigeharu , YAMAZAKI Hiroki , KAWAKUBO Tasuyuki

    The low frequency noise and the oscillatory microwave power spectrum have been simultaneously measured on the Gunn diode in order to investigate the critical phenomenon near the threshold of the Gunn …

    Journal of the Physical Society of Japan 40(4), p921-924, 1976-04

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