CiNii 国立情報学研究所 学術情報ナビゲータ[サイニィ]
ID:9000301386022
産総研 National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology (AIST) (2015年 CiNii収録論文より)
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KISHIKAWA Ryoko , HORIBE Masahiro
NMIJ has been developed a new method for calibrating impedance of test instrument with vector network analyzer. Five specific transfer standards are needed with the method. The merit is that the SI tr …
電子情報通信学会総合大会講演論文集 2015年_エレクトロニクス(1), "SS-5"-"SS-6", 2015-02-24