Daio Takeshi

ID:9000303992193

Res. Lab. for High Voltage Electron Microscopy, Kyushu Univ. (2015年 CiNii収録論文より)

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論文一覧:  1件中 1-1 を表示

  • Structural Evaluation of β-AlN Films Grown on Sapphire (0001) Substrates

    Yoshida Tomohiro , Ueda Yūtaro , Daio Takeshi , Tominaga Aki , Okajima Toshihiro , Yoshitake Tsuyoshi

    β-AlN thin films with different thickness were grown on sapphire(0001) substrates with a smooth surface in a nitrogen atmosphere by pulsed laser deposition using a sintered AlN target, and their films …

    Transactions of the Materials Research Society of Japan 40(3), 191-194, 2015

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