尾藤 洋一 BITOU Youichi

ID:9000398983340

産総研 AIST(National Institute of Advanced Industrial Science and Technology) (2018年 CiNii収録論文より)

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  • Development of vacuum-pressure measurement device by refractivity measurement  [in Japanese]

    TAKEI Yoshinori , YOSHIDA Hajime , ARAI Kenta , TELADA Souichi , BITOU Youichi , KOBATA Tokihiko

    The pressure <i>p</i> is proportional to the refractive index (<i>n</i><sub>gas</sub>-1). The refractive index can be measured from the resonance frequency of the l …

    Abstract of annual meeting of the Surface Science of Japan 2018(0), 44, 2018

    J-STAGE 

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