李 万里, 孫 晴晴, 神谷 庄司, 宍戸 信之, 泉 隼人, 関根 智仁, 小金丸 正明, 三成 剛生
年次大会
2019
(0),
J22315-,
2019
<p>A novel bending test technique<sup>(1)</sup> was applied to a micro-scale transistor device fabricated with an organic semiconductor printed on a flexible substrate. I-V behavior (drain current …
DOI
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