Testing's impact on design & technology : International Test Conference, 1986, proceedings, September 8, 9, 10, 11, 1986

著者

• International Test Conference
• IEEE Computer Society
• Institute of Electrical and Electronics Engineers. Philadelphia Section

書誌事項

Testing's impact on design & technology : International Test Conference, 1986, proceedings, September 8, 9, 10, 11, 1986

sponsored by the IEEE Computer Society [and] IEEE Philadelphia Section

IEEE Computer Society Press, c1986

• pbk.
• microfiche
• hard

注記

Includes bibliographies and index

"IEEE catalog no. 86CH2339-0."

詳細情報

• NII書誌ID(NCID): BA04429152
• ISBN:
  • 0818607262
  • 0818647264
  • 0818687266
• LCCN: 86228406
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Washington, D.C.
• ページ数/冊数: xxx, 1009 p.
• 大きさ: 28 cm
• 分類:
  • LCC : TK7874
  • DC19 : 621.381/73
• 件名:
  • LCSH : Integrated circuits -- Testing -- Congresses
  • LCSH : Semiconductors -- Testing -- Congresses