13th IEEE VLSI Test Symposium : April 30-May 3, 1995, Princeton, New Jersey : proceedings

著者

• IEEE VLSI Test Symposium
• IEEE Computer Society. Technical Committee on Test Technology
• Institute of Electrical and Electronics Engineers. Philadelphia Section

書誌事項

13th IEEE VLSI Test Symposium : April 30-May 3, 1995, Princeton, New Jersey : proceedings

sponsored by IEEE Computer Society Technical Committee on Test Technology, IEEE Philadelphia Section

IEEE Computer Society Press, c1995

• pbk.

タイトル別名

Thirteenth IEEE VLSI Test Symposium

注記

Includes bibliographical references and index

詳細情報

• NII書誌ID(NCID): BA25972389
• ISBN:
  • 0818670002
• LCCN: 94072870
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Los Alamitos, Calif.
• ページ数/冊数: xx, 493 p.
• 大きさ: 28 cm
• 分類:
  • LCC : TK7874
  • DC20 : 621.39/5/0287
• 件名:
  • LCSH : Integrated circuits -- Very large scale integration -- Testing -- Congresses