Proceedings : Sixth Asian Test Symposium (ATS '97), November 17-19, 1997, Akita, Japan

著者

• Asian Test Symposium
• IEEE Computer Society. Technical Committee on Test Technology

書誌事項

Proceedings : Sixth Asian Test Symposium (ATS '97), November 17-19, 1997, Akita, Japan

sponsored by IEEE Computer Society Test Technology Technical Committee ; in cooperation with Technical Group on Fault Tolerant Systems, IEICE ... [et al.]

IEEE Computer Society Press, c1997

タイトル別名

97TB100205

注記

"IEEE order plan catalog number 97TB100205"

Includes bibliographies and index

内容説明・目次

内容説明

Areas covered in this text include: test generation; design for testability; fault tolerance; case studies for DFT techniques in Japanese industry; test technologies; beam testing of VLSI circuits in Japan; mixed-signal test; novel beam testing techniques in Japan; and current testing.

「Nielsen BookData」 より

詳細情報

• NII書誌ID(NCID): BA43673663
• ISBN:
  • 0818682094
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Los Alamitos, Ca.
• ページ数/冊数: xv, 418 p.
• 大きさ: 28 cm
• 分類:
  • LCC : TK7874
  • DC20 : 621.381/548
• 件名:
  • LCSH : Integrated circuits -- Testing -- Congresses
  • LCSH : Automatic test equipment -- Congresses