Proceedings of the 11th Asian Test Symposium (ATS '02), 18-20 November 2002, Guam, USA

著者

• Asian Test Symposium
• IEEE Computer Society. Test Technology Technical Council
• IEICE. Technical Group on Dependable Computing
• IPS Japan. Special Interest Group on System LSI Design Methodology

書誌事項

Proceedings of the 11th Asian Test Symposium (ATS '02), 18-20 November 2002, Guam, USA

sponsored by IEEE Computer Society Test Technology Technical Council (TTTC) ; in cooperation with Technical Group on Dependable Computing, IEICE, Special Interest Group on System LSI Design Methodology, IPS Japan

IEEE Computer Society, c2002

タイトル別名

Proceedings of the eleventh Asian Test Symposium

ATS '02

PR01825

注記

"IEEE Computer Society Order Number PR01825"--T.p. verso

Includes bibliographical references and index

内容説明・目次

内容説明

Held in Guam in November of 2002, the symposium on the test technologies and research issues related to silicon chip production, resulted in the 74 papers presented here. The papers are organized into sections related to the symposium sessions on test generation, on-line testing, analog and mixed si

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詳細情報

• NII書誌ID(NCID): BA61756208
• ISBN:
  • 0769518257
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Los Alamitos, Calif.
• ページ数/冊数: xxi, 437 p.
• 大きさ: 28 cm