Records of the 2003 International Workshop on Memory Technology, Design and Testing, 28-29 July 2003, San Jose, California

著者

• IEEE International Workshop on Memory Technology, Design, and Testing
• Singh, Adit
• Wik, Thomas
• Rajsuman, Rochit
• IEEE Computer Society
• IEEE Computer Society. Test Technology Technical Council
• IEEE Computer Society. Technical Committee on VLSI
• IEEE Solid-State Circuits Society

書誌事項

Records of the 2003 International Workshop on Memory Technology, Design and Testing, 28-29 July 2003, San Jose, California

sponsored by IEEE Computer Society, IEEE Computer Society Technical Committee on VLSI, IEEE Computer Society Technical Council on Test Technology ; in cooperation with IEEE Solid State Circuits Society ; [edited by Tom Wik, Adit Singh, and Rochit Rajsuman]

IEEE Computer Society, c2003

タイトル別名

PR02004

MTDT 2003

Records of the 2003 IEEE International Workshop on Memory Technology, Design and Testing

注記

"IEEE Computer Society Order Number PR02004" -- T. p. verso

Includes bibliographical references and index

詳細情報

• NII書誌ID(NCID): BA65806250
• ISBN:
  • 0769520049
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Los Alamitos, Calif.
• ページ数/冊数: ix, 95 p.
• 大きさ: 28 cm