18th annual proceedings : Reliability Physics 1980, Las Vegas, Nevada, April 8-10, 1980

Author(s)

• International Reliability Physics Symposium
• IEEE Electron Devices Society
• IEEE Reliability Society

Bibliographic Information

18th annual proceedings : Reliability Physics 1980, Las Vegas, Nevada, April 8-10, 1980

sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society

Electron Device Society and Reliability Society of the Institute of Electrical and Electronics Engineers, c1980

Other Title

Reliability Physics, 18th Annual proceedings 1980

Note

"1980 International Reliability Physics Symposium"--T.p. verso

General chairman: G.T. Cheney

"IEEE catalog no. 80CH1531-3."

"Libray of Congress Catalog Card no. 79-92901."

Includes bibliographical references

Details

• NCID: BA65962314
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: New York, N.Y.
• Pages/Volumes: vii, 339 p.
• Size: 28 cm
• Subject Headings:
  • LCSH : Electronic apparatus and appliances -- Reliability Congresses
  • LCSH : Electronic apparatus and appliances -- Testing Congresses
  • LCSH : Integrated circuits -- Reliability Congresses
  • LCSH : Integrated circuits -- Testing Congresses