Electron microscopy and analysis 2003 : proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, University of Oxford, 3-5 September 2003
著者
書誌事項
Electron microscopy and analysis 2003 : proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, University of Oxford, 3-5 September 2003
（Institute of Physics conference series, no. 179）
Institute of Physics, c2004
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注記
Includes bibliographical references and indexes
内容説明・目次
内容説明
Electron microscopy is now a mainstay characterization tool for solid state physicists and chemists as well as materials scientists. Containing the proceedings from the Electron Microscopy and Analysis Group (EMAG) conference in September 2003, this volume covers current developments in the field, primarily in the UK. These conferences are biennial events organized by the EMAG of the Institute of Physics to provide a forum for discussion of the latest developments in instrumentation, techniques, and applications of electron and scanning probe microscopies.
目次
Plenary Lectures Functional Materials and Biomaterials New Instrumentation Imaging Theory Theory of Microscopy and Spectroscopy Structural Materials Advances in Nanoanalysis Advances in Imaging Sample Preparation and Nanofabrication Surfaces and Interfaces Nanomaterials Author Index Subject Index
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