2005 IEEE International Workshop on Memory Technology, Design and Testing : MTDT 2005 : 3-5 August, 2005, Taipei, Taiwan

Author(s)

• IEEE International Workshop on Memory Technology, Design, and Testing
• IEEE Computer Society. Test Technology Technical Council
• 清華大学 セイカ ダイガク qing hua da xue

Bibliographic Information

2005 IEEE International Workshop on Memory Technology, Design and Testing : MTDT 2005 : 3-5 August, 2005, Taipei, Taiwan

IEEE Computer Society Test Technology Technical Council ; co-sponsored by National Tsing Hua University

IEEE Computer Society, c2005

Note

"IEEE Computer Society Order Number P2313"--T.p. verso

Includes bibliographical references and author index

Details

• NCID: BA80823517
• ISBN:
  • 0769523137
• LCCN: 2006278060
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Los Alamitos, Calif.
• Pages/Volumes: xxv, 153 p.
• Size: 27 cm
• Classification:
  • LCC : TK7895.M4
  • DC22 : 621.39/732
• Subject Headings:
  • LCSH : Semiconductor storage devices -- Testing -- Congresses
  • LCSH : Random access memory -- Congresses