Proceedings : 25th IEEE VLSI Test Symposium : 6-10 May, 2007, Berkeley, California

著者

• IEEE VLSI Test Symposium
• IEEE Computer Society. Test Technology Technical Council

書誌事項

Proceedings : 25th IEEE VLSI Test Symposium : 6-10 May, 2007, Berkeley, California

[sponsored by IEEE Computer Society Test Technology Technical Council]

IEEE Computer Society, c2007

タイトル別名

25th IEEE VLSI Test Symposium : proceedings : May 46-10, 2007, Berkeley, California

VTS07

VLSI Test Symposium

注記

"IEEE Computer Society Order Number P2812"--T.p. verso

Includes bibliographical references and index

詳細情報

• NII書誌ID(NCID): BA82718998
• ISBN:
  • 9780769528120
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Los Alamitos, Calif.
• ページ数/冊数: xxx, 484 p.
• 大きさ: 28 cm
• 分類:
  • LCC : TK7874
• 件名:
  • LCSH : Integrated circuits -- Very large scale integration -- Testing -- Congresses