Forensic evidence analysis and crime scene investigation : 20-21 November 1996, Boston, Massachusetts

著者

• Hicks, John
• De Forest, Peter R.
• Baylor, Vivian M.
• United States. National Institute of Standards and Technology
• National Institute of Justice (U.S.)
• Society of Photo-optical Instrumentation Engineers

書誌事項

Forensic evidence analysis and crime scene investigation : 20-21 November 1996, Boston, Massachusetts

John Hicks, Peter R. De Forest, Vivian M. Baylor, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering ; cosponsored by National Institute of Standards and Technology ... [et al.] ; cooperating organizations, National Institute of Justice ... [et al.]

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 2941）

SPIE, c1997

注記

Includes bibliographic references and author index

詳細情報

• NII書誌ID(NCID): BA86159049
• ISBN:
  • 0819423432
• LCCN: 96069891
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Bellingham, Wash., USA
• ページ数/冊数: v, 148 p.
• 大きさ: 28 cm
• 分類:
  • LCC : HV8073
• 件名:
  • LCSH : Electronics in criminal investigation -- Congresses
  • LCSH : Crime scene searches -- Congresses
  • LCSH : Forensic sciences -- Congresses
  • LCSH : Law enforcement -- Optical equipment -- Congresses
• 親書誌ID:
  • BA0022700X