2008 IEEE International Test Conference (ITC) : Santa Clara, California, 28-30 October, 2008

著者

• Institute of Electrical and Electronics Engineers
• International Test Conference

書誌事項

2008 IEEE International Test Conference (ITC) : Santa Clara, California, 28-30 October, 2008

Institute of Electrical and Electronics Engineers, c2008

• Pages 1-534
• Pages 535-1062

注記

IEEE Catalog Number: CEP08ITC-PRT

Includes bibliographical references and index

詳細情報

• NII書誌ID(NCID): BA89307051
• ISBN:
  • 9781424424023
  • 9781424424023
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Piscataway, N.J.
• ページ数/冊数: 2 v.
• 大きさ: 28 cm