2011 IEEE International Test Conference (ITC 2011) : Anaheim, California, USA, 20-22 September 2011

Author(s)

• International Test Conference
• Institute of Electrical and Electronics Engineers

Bibliographic Information

2011 IEEE International Test Conference (ITC 2011) : Anaheim, California, USA, 20-22 September 2011

IEEE, c2011

Other Title

CFP11ITC-PRT

Note

IEEE Catalog Number: CFP11ITC-PRT

Includes bibliographical references and index

Details

• NCID: BB09151458
• ISBN:
  • 9781457701535
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Piscataway, N.J.
• Pages/Volumes: 508 p.
• Size: 27 cm