Studies on the fault diagnosis of analog circuits アナログ回路の故障診断に関する研究

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著者

    • 林, 争輝 リン, ツェンフィ

書誌事項

タイトル

Studies on the fault diagnosis of analog circuits

タイトル別名

アナログ回路の故障診断に関する研究

著者名

林, 争輝

著者別名

リン, ツェンフィ

学位授与大学

東京大学

取得学位

博士 (工学)

学位授与番号

乙第10642号

学位授与年月日

1992-03-16

注記・抄録

博士論文

目次

  1. Contents / (0003.jp2)
  2. Chapter 1 Introduction / p1 (0004.jp2)
  3. 1-1 Backgroud of This Work / p1 (0004.jp2)
  4. 1-2 Motivations and Objectives of This Work / p11 (0009.jp2)
  5. 1-3 Synopese of Chapters / p17 (0012.jp2)
  6. References / p22 (0015.jp2)
  7. Chapter 2 Fundamentals of Fault Diagnosis / p29 (0018.jp2)
  8. 2-1 The Area of Analog Circuit Fault Diagnosis / p29 (0018.jp2)
  9. 2-2 Basic Concepts and Definitions / p31 (0019.jp2)
  10. 2-3 Historical Survey with Circuit and System Theory / p35 (0021.jp2)
  11. References / p47 (0027.jp2)
  12. Chapter 3 Fault Diagnosis of Linear Circuits / p51 (0029.jp2)
  13. 3-1 Fault-Excitation Theory / p51 (0029.jp2)
  14. 3-2 To Solve the Location Problem / p62 (0035.jp2)
  15. 3-3 To Solve the Identification Problem / p67 (0037.jp2)
  16. 3-4 Applied Example / p69 (0038.jp2)
  17. 3-5 Conclusion / p70 (0039.jp2)
  18. References / p71 (0039.jp2)
  19. Chapter 4 Fault Diagnosis of Active Circuits / p72 (0040.jp2)
  20. 4-1 Costitutive Relation of General Active Branch / p72 (0040.jp2)
  21. 4-2 Topological Analysis of Active Circuits / p74 (0041.jp2)
  22. 4-3 Diagnosis Equation for Active Circuits / p82 (0045.jp2)
  23. 4-4 Applied Example / p94 (0051.jp2)
  24. 4-5 Conclusion / p96 (0052.jp2)
  25. References / p96 (0052.jp2)
  26. Chapter 5 Fault Diagnosis of Dynamic and Nonlinear Circuits / p97 (0052.jp2)
  27. 5-1 General Idea and Principle / p97 (0052.jp2)
  28. 5-2 Solution of General Diagnosis Equation / p103 (0055.jp2)
  29. 5-3 Diagnosis for Linear Case / p104 (0056.jp2)
  30. 5-4 Diagnosis for Dynamic Case / p106 (0057.jp2)
  31. 5-5 Diagnosis for Nolinear Case / p111 (0059.jp2)
  32. 5-6 Applied Examples / p115 (0061.jp2)
  33. 5-7 Conclusion / p120 (0064.jp2)
  34. References / p121 (0064.jp2)
  35. Chapter 6 Diagnosability and Testability / p123 (0065.jp2)
  36. 6-1 The Concept of Local Diagnosability / p123 (0065.jp2)
  37. 6-2 Diagnosability and Testability of Linear Circuits / p123 (0065.jp2)
  38. 6-3 Diagnosability and Testability of Dynamic Circuits / p129 (0068.jp2)
  39. 6-4 Diagnosability and Testability of Nonlinear Circuits / p136 (0072.jp2)
  40. 6-5 A Typical Problem-Diagnosability and Testability of Single Branch Fault / p138 (0073.jp2)
  41. 6-6 Conclusion / p142 (0075.jp2)
  42. References / p143 (0075.jp2)
  43. Chapter 7 A Diagnosis Approach Based on New Fundamentals / p145 (0076.jp2)
  44. 7-1 Network Variable Equation-New Fundamentals / p145 (0076.jp2)
  45. 7-2 Analog Circuit Fault Location Approach / p153 (0080.jp2)
  46. 7-3 Analog Circuit Fault Identification Approch / p159 (0083.jp2)
  47. 7-4 Applied Example / p161 (0084.jp2)
  48. 7-5 Conclusion / p171 (0089.jp2)
  49. References / p172 (0090.jp2)
  50. Chapter 8 Summary Conclusion and Recommendation / p174 (0091.jp2)
  51. 8-1 Summary / p174 (0091.jp2)
  52. 8-2 Conlusion / p175 (0091.jp2)
  53. 8-3 Recommendation / p178 (0093.jp2)
  54. References / p180 (0094.jp2)
  55. Appendix(Publications) / (0094.jp2)
  56. Acknowledgement / (0097.jp2)
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各種コード

  • NII論文ID(NAID)
    500000098286
  • NII著者ID(NRID)
    • 8000000098515
  • DOI(NDL)
  • NDL書誌ID
    • 000000262600
  • データ提供元
    • NDL-OPAC
    • NDLデジタルコレクション
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