A "checking" system for circuits control and optimization of fluorite flotation plants 蛍石浮選工場の制御と最適化のための検査システム

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著者

    • Bissombolo, Abel ビソンボロ, アベル

書誌事項

タイトル

A "checking" system for circuits control and optimization of fluorite flotation plants

タイトル別名

蛍石浮選工場の制御と最適化のための検査システム

著者名

Bissombolo, Abel

著者別名

ビソンボロ, アベル

学位授与大学

九州大学

取得学位

博士 (工学)

学位授与番号

甲第3751号

学位授与年月日

1996-03-27

注記・抄録

博士論文

目次

  1. 論文要旨 / (0004.jp2)
  2. 論文目録 / (0006.jp2)
  3. CONTENTS / (0007.jp2)
  4. INTRODUCTION / p1 (0012.jp2)
  5. FLUORITE FLOTATION OUTLINE / p6 (0017.jp2)
  6. RESEARCH PLAN / p10 (0021.jp2)
  7. PART ONE-PRELIMINARY MINERALOGICAL INVESTIGATIONS / p12 (0023.jp2)
  8. CHAPTER 1-SAMPLING AND SIZE FRACTIONATION / p13 (0024.jp2)
  9. CHAPTER 2-PHOTOGRAPHING OF MINERALS / p25 (0036.jp2)
  10. 2.1-Preparation of minerals / p25 (0036.jp2)
  11. 2.2-Equipment / p25 (0036.jp2)
  12. 2.3-Procedure / p26 (0037.jp2)
  13. 2.4-Results of photographing / p26 (0037.jp2)
  14. CHAPTER 3-X-RAY POWDER DIFFRACTION ANALYSIS / p30 (0041.jp2)
  15. 3.1-Preparation of samples / p30 (0041.jp2)
  16. 3.2-Equipment and procedure / p31 (0042.jp2)
  17. 3.3-Results of investigations and discussion / p31 (0042.jp2)
  18. CHAPTER 4-X-RAY POWDER FLUORESCENCE ANALYSIS / p39 (0050.jp2)
  19. 4.1-Sample preparation / p39 (0050.jp2)
  20. 4.2-Research procedure / p39 (0050.jp2)
  21. 4.3-Results of investigations and discussion / p40 (0051.jp2)
  22. CHAPTER 5-ELECTRON PROBE MICRO-ANALYSIS / p46 (0057.jp2)
  23. 5.1-Sample mounting / p46 (0057.jp2)
  24. 5.2-Running EPMA / p47 (0058.jp2)
  25. 5.3-Results of investigations and discussion / p48 (0059.jp2)
  26. CHAPTER 6-CONCLUSIONS AND SUGGESTIONS / p53 (0064.jp2)
  27. PART TWO-ANALYSIS OF FLUORITE ORE AND PRODUCTS FROM AN OPERATING FLOTATION PLANT / p54 (0065.jp2)
  28. CHAPTER 1-INTRODUCTION / p55 (0066.jp2)
  29. CHAPTER 2-SAMPLING AND SAMPLE PREPARATION / p57 (0068.jp2)
  30. 2.1-Sampling / p57 (0068.jp2)
  31. 2.2-Sample preparation / p58 (0069.jp2)
  32. CHAPTER 3-WATER ANALYSIS / p61 (0072.jp2)
  33. 3.1-Introduction / p61 (0072.jp2)
  34. 3.2-Preparation of samples / p61 (0072.jp2)
  35. 3.3-Procedure and measurement / p62 (0073.jp2)
  36. 3.4-Results of analysis and discussion / p72 (0083.jp2)
  37. CHAPTER 4-CHEMICAL AND X-RAY ANALYSIS / p75 (0086.jp2)
  38. 4.1-Chemical analysis / p75 (0086.jp2)
  39. 4.2-X-ray analyses / p75 (0086.jp2)
  40. CHAPTER 5-SIEVING TESTS / p77 (0088.jp2)
  41. 5.1-Equipment / p77 (0088.jp2)
  42. 5.2-Procedure / p77 (0088.jp2)
  43. 5.3-Results of analysis and discussion / p77 (0088.jp2)
  44. CHAPTER 6-X-RAY POWDER DIFFRACTION ANALYSIS / p92 (0103.jp2)
  45. 6.1-Procedure / p92 (0103.jp2)
  46. 6.2-Results and analysis / p92 (0103.jp2)
  47. CHAPTER 7-MICROSCOPIC COUNTING AND LIBERATION ANALYSIS / p97 (0108.jp2)
  48. 7.1-Introduction / p97 (0108.jp2)
  49. 7.2-Samples preparation / p97 (0108.jp2)
  50. 7.3-Procedure and measurement / p97 (0108.jp2)
  51. 7.4-Results of analysis and discussion / p101 (0112.jp2)
  52. 7.5-Gaudin's liberation distribution analysis / p110 (0121.jp2)
  53. 7.6-Efficiency of the concentration process / p115 (0126.jp2)
  54. 7.7-Formulae for the computation of the deportment and approximate recovery / p121 (0132.jp2)
  55. CHAPTER 8-CONCLUSIONS AND SUGGESTIONS / p124 (0135.jp2)
  56. PART THREE-FULL SCALE TESTING OF AN OPERATING FLUORITE FLOTATION PLANT / p125 (0136.jp2)
  57. CHAPTER 1-INTRODUCTION / p126 (0137.jp2)
  58. CHAPTER 2-SAMPLING AND SIEVING / p128 (0139.jp2)
  59. 2.1-Sampling / p128 (0139.jp2)
  60. 2.2-Sieving / p128 (0139.jp2)
  61. CHAPTER 3-MICROSCOPIC COUNTING / p141 (0152.jp2)
  62. 3.1-Procedure and methods / p141 (0152.jp2)
  63. 3.2-Analysis of the results / p141 (0152.jp2)
  64. 3.3-Others methods of analysis / p163 (0174.jp2)
  65. 3.4-Efficiency of the separation / p163 (0174.jp2)
  66. CHAPTER 4-X-RAY DIFFRACTION ANALYSIS / p169 (0180.jp2)
  67. CHAPTER 5-CONCLUSIONS AND SUGGESTIONS / p170 (0181.jp2)
  68. CONCLUSIONS / p171 (0182.jp2)
  69. REFERENCES / p174 (0185.jp2)
  70. APPENDIX 1-STARTING AND ENDING XRD / p177 (0188.jp2)
  71. APPENDIX 2-STARTING AND ENDING XRF / p178 (0189.jp2)
  72. APPENDIX 3-ANALYZING CRISTAL/DETECTOR SELECTION CHART FOR XRF ANALYSIS / p179 (0190.jp2)
  73. APPENDIX 4-STARTING AND ENDING EPMA / p180 (0191.jp2)
  74. APPENDIX 5-TABLES FOR DETECTED POSITION OF CHARACTERISTIC X-RAY FOR EPMA / p182 (0193.jp2)
  75. APPENDIX 6-PRINCIPLES OF THE “CHECKING” SYSTEM MODEL / p185 (0196.jp2)
  76. LIST OF FIGURES AND PLATES / p188 (0199.jp2)
  77. LIST OF TABLES / p192 (0203.jp2)
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各種コード

  • NII論文ID(NAID)
    500000131511
  • NII著者ID(NRID)
    • 8000000131782
  • DOI(NDL)
  • NDL書誌ID
    • 000000295825
  • データ提供元
    • NDL ONLINE
    • NDLデジタルコレクション

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