ID:DA04123942
Bullis, W. M. (W. Murray)
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editors, W.M. Bullis, D.G. Seiler, A.C. Diebold
American Institute of Physics 1996
Available at 16 libraries
edited by W. Murray Bullis, Ulrich Gösele, Fumio Chimura ; assistant editors, W. Bergholz ... [et al.] ; Electronics and Dielectric Science and Technology Divisions
Electrochemical Society c1991 Proceedings / [Electrochemical Society] v. 91-9
Available at 1 libraries
edited by W.M. Bullis, S. Broydo ; assistant editors, J. Andrews ... [et al.] ;
Electrochemical Society c1985 Proceedings / [Electrochemical Society] v. 85-5
Available at 3 libraries
edited by W. Murray Bullis, L.C. Kimerling ; assistant editors, J. Andrews ... [et al.]
Electrochemical Society c1983 Proceedings / [Electrochemical Society] v. 83-9
edited by Conrad J. Dell'Oca, W. Murray Bullis ; assistant editors, S. Broydo ... [et al.] ; [sponsored by] Electronics and Dielectrics and Insulation Divisions
Electrochemical Society c1982 Proceedings / [Electrochemical Society] v. 82-7
Available at 2 libraries
W. Murray Bullis, editor
U.S. G.P.O. 1979 NBS special publication 400-38 . Semiconductor measurement technology
W. Murray Bullis and J. Franklin Mayo-Wells, editors
U.S. G.P.O. 1978 NBS special publication 400-36 . Semiconductor measurement technology
U.S. G.P.O. 1977 NBS special publication 400-29 . Semiconductor measurement technology
U.S. G.P.O. 1976 NBS special publication 400-25 . Semiconductor measurement technology
U.S. G.P.O. 1976 NBS special publication 400-19 . Semiconductor measurement technology
U.S. G.P.O. 1975 NBS special publication 400-17 . Semiconductor measurement technology
U.S. G.P.O. 1975 NBS special publication 400-12 . Semiconductor measurement technology
U.S. G.P.O. 1975 NBS special publication 400-8 . Semiconductor measurement technology
U.S. G.P.O. 1974 NBS special publication 400-4 . Semiconductor measurement technology
U.S. G.P.O. 1974 NBS special publication 400-1 . Semiconductor measurement technology