ID:DA13028454
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edited by John Thong ... [et al.] ; organised by IEEE Reliability/CPMT/ED Singapore Chapter ; technical co-sponsored by IEEE Electron Devices Society, IEEE Reliability Society ; in co-operation with Centre for IC Failure Analysis & Reliability, National University of Singapore
Institute of Electrical and Electronics Engineers c2002
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Wai Kin Chim
Wiley c2000
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