Proceedings of the 9th International Symposium on the Physical & Failure Analysis of Integrated Circuits, IPFA 2002

著者

• International Symposium on the Physical & Failure Analysis of Integrated Circuits
• Thong, John T. L.
• IEEE Singapore Section. Reliability/CPMT/EDA Chapter
• IEEE Electron Devices Society
• National University of Singapore. Centre for IC Failure Analysis and Reliability
• IEEE Reliability Society
• Tan, Wilson
• Chim, Wai Kin
• Lee, Kheng Chooi

書誌事項

Proceedings of the 9th International Symposium on the Physical & Failure Analysis of Integrated Circuits, IPFA 2002

edited by John Thong ... [et al.] ; organised by IEEE Reliability/CPMT/ED Singapore Chapter ; technical co-sponsored by IEEE Electron Devices Society, IEEE Reliability Society ; in co-operation with Centre for IC Failure Analysis & Reliability, National University of Singapore

Institute of Electrical and Electronics Engineers, c2002

タイトル別名

9th International Symposium on th Physical & Failure Analysis of Integrated Circuits 2002

IPFA 2002 proceedings

2TH8614

注記

"IEEE catalog number 02TH8614"--T.p. verso

Includes bibliographical references and index

"8-12 July 2002, Raffles City Convention Centre, Singapore" in cover

Other editors : Wilson Tan, Chim Wai Kin, Lee Kheng Chooi

詳細情報

• NII書誌ID(NCID): BA66217936
• ISBN:
  • 0780374169
• LCCN: 2002100970
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Piscataway, N.J.
• ページ数/冊数: 258 p.
• 大きさ: 30 cm