Scanning electron microscopy/1977/I : Proceedings of the 10th Annual Scanning Electron Microscope Symposium and workshops on materials and component characterization/quality control with the SEM/STEM, SEM applications to semiconductors, analytical electron microscopy, biological specimen preparation for SEM, March 28 - April 1, 1977 : Sessions held at McCormick INN, Chicago, Illinois

書誌事項

Scanning electron microscopy/1977/I : Proceedings of the 10th Annual Scanning Electron Microscope Symposium and workshops on materials and component characterization/quality control with the SEM/STEM, SEM applications to semiconductors, analytical electron microscopy, biological specimen preparation for SEM, March 28 - April 1, 1977 : Sessions held at McCormick INN, Chicago, Illinois

edited by Om Johari ; sponsored by IIT research Institute

IIT Research Institute, [1977].

  • Vol. 1
  • Complete Set

タイトル別名

Scanning electron microscopy

SEM

大学図書館所蔵 件 / 13

この図書・雑誌をさがす

詳細情報

  • NII書誌ID(NCID)
    BA22283161
  • ISBN
    • 0915802112
    • 0915802007
  • LCCN
    72626068
  • 出版国コード
    us
  • タイトル言語コード
    eng
  • 本文言語コード
    eng
  • 出版地
    Chicago
  • ページ数/冊数
    xvi, 783 p.
  • 大きさ
    29 cm
ページトップへ