Remarkable Enhancement of Sensitivity with the Second Generation of Elliptically Polarization-detected Circular Dichroism Spectroscopy

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  • Makoto Murakami
    Institute of Multidisciplinary Research for Advanced Materials, Tohoku University
  • Yasuyuki Araki
    Institute of Multidisciplinary Research for Advanced Materials, Tohoku University
  • Seiji Sakamoto
    Institute of Multidisciplinary Research for Advanced Materials, Tohoku University
  • Yoshiki Hamada
    Institute of Multidisciplinary Research for Advanced Materials, Tohoku University
  • Takehiko Wada
    Institute of Multidisciplinary Research for Advanced Materials, Tohoku University

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Abstract

<jats:title>Abstract</jats:title> <jats:p>A new circular dichroism (CD) measurement system based on the detection of elliptically polarized light has been proposed. The approach has several unique and inherent advantages, such as sensitivities, reliability, and reproducibility, over conventional systems and Kliger’s pioneering work. We have rederived the Jones calculus and introduced the angular term into the formulation revealing that this approach should improve the signal intensity by controlling the light ellipticity. Therefore, we have first demonstrated the hypothesis by the quantitative analysis of the signal intensity measuring of the split CD pattern of tris(bipyridine)ruthenium(II) dichloride with the system. The CD signals increasing with decreasing the azimuth of retarder was clearly observed, enabling detection of CD signal with high sensitivity.</jats:p>

Journal

  • Chemistry Letters

    Chemistry Letters 42 (3), 261-262, 2013-02-23

    Oxford University Press (OUP)

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