Growth of CdTe and Hg[x]Cd[1-x]Te films by hot-wall epitaxy and its characterization ホットウォールエピタキシー法によるCdTe及びHg[x]Cd[1-x]Te薄膜の成長及び評価
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著者
書誌事項
- タイトル
-
Growth of CdTe and Hg[x]Cd[1-x]Te films by hot-wall epitaxy and its characterization
- タイトル別名
-
ホットウォールエピタキシー法によるCdTe及びHg[x]Cd[1-x]Te薄膜の成長及び評価
- 著者名
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立岡, 浩一
- 著者別名
-
タツオカ, ヒロカズ
- 学位授与大学
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静岡大学
- 取得学位
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工学博士
- 学位授与番号
-
乙第41号
- 学位授与年月日
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1992-02-20
注記・抄録
博士論文
目次
- Abstract / p1 (0003.jp2)
- Contents / (0004.jp2)
- 1.Introduction / p1 (0005.jp2)
- References / p3 (0006.jp2)
- 2. Growth of CdTe(100)and(111)B films on GaAs(100)substrates / p5 (0007.jp2)
- 2-1. Introduction / p5 (0007.jp2)
- 2-2. Sample preparation / p6 (0008.jp2)
- 2-3. Characterization of CdTe(100)films on GaAs(100)substrates / p9 (0009.jp2)
- 2-4. Characterization of CdTe(111)B films on GaAs(100)substrates / p19 (0014.jp2)
- 2-5. Conclusion / p27 (0018.jp2)
- References / p29 (0019.jp2)
- 3. Growth of CdTe(111)B films on sapphire(0001)substrates / p30 (0020.jp2)
- 3-1. Introduction / p30 (0020.jp2)
- 3-2. Growth procedure / p30 (0020.jp2)
- 3-3. Characterization of CdTe(111)B films on sapphire(0001)substrates / p30 (0020.jp2)
- 3-4. Conclusion / p36 (0023.jp2)
- References / p36 (0023.jp2)
- 4. Growth of CdTe homoepitaxial films / p38 (0024.jp2)
- 4-1. Introduction / p38 (0024.jp2)
- 4-2. Experimental procedure / p38 (0024.jp2)
- 4-3. Characterization of CdTe homoepitaxial films / p38 (0024.jp2)
- 4-4. Conclusion / p47 (0028.jp2)
- References / p47 (0028.jp2)
- 5. Growth of HgTe and [化学式] films / p48 (0029.jp2)
- 5-1. Introduction / p48 (0029.jp2)
- 5-2. Growth procedure / p48 (0029.jp2)
- 5-3. Characterization of HgTe films / p49 (0029.jp2)
- 5-4. Characterization of [化学式] films / p51 (0030.jp2)
- 5-5. Conclusion / p53 (0031.jp2)
- References / p53 (0031.jp2)
- 6.Strain relaxation / p54 (0032.jp2)
- 6-1.Introduction / p54 (0032.jp2)
- 6-2.Summary of the strain relaxation for CdTe(100)/GaAs(100) / p55 (0032.jp2)
- 6-3.Strain relaxation model / p59 (0034.jp2)
- 6-4.Application to other systems / p61 (0035.jp2)
- 6-5.Conclusion / p63 (0036.jp2)
- References / p63 (0036.jp2)
- 7.Summary / p65 (0037.jp2)
- Acknowledgments / p67 (0038.jp2)
- Appendix A Deformation of crystalline lattices / p68 (0039.jp2)
- B Shift of energy bands under strain / p70 (0040.jp2)
- C Deformation of films using Bimetal model / p73 (0041.jp2)
- References / p75 (0042.jp2)
- Addendum / p76 (0043.jp2)