Scanning electron microscopy : physics of image formation and microanalysis

Author(s)

• Reimer, Ludwig

Bibliographic Information

Scanning electron microscopy : physics of image formation and microanalysis

Ludwig Reimer

（Springer series in optical sciences, v. 45）

Springer-Verlag, c1985

• : N.Y.
• : Berlin

Note

Bibliography: p. [405]-446

Includes index

• NCID: BA00063343
• ISBN:
  • 0387135308
  • 3540135308
• LCCN: 85012627
• Country Code: gw
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Berlin ; Tokyo
• Pages/Volumes: xviii, 457 p.
• Size: 24 cm
• Classification:
  • NDLC : ND448
  • LCC : QH212.S3
  • DC19 : 535/.3325
• Subject Headings:
  • LCSH : Scanning electron microscope
• Parent Bibliography ID:
  • BA00063354