Fundamentals of surface and thin film analysis

Author(s)

• Feldman, Leonard C.
• Mayer, James W.

Bibliographic Information

Fundamentals of surface and thin film analysis

Leonard C. Feldman, James W. Mayer

North-Holland : Elsevier Science Pub., c1986

Note

Includes bibliographies and index

Details

• NCID: BA0028903X
• ISBN:
  • 0444009892
• LCCN: 86002479
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: New York
• Pages/Volumes: xviii, 352 p.
• Size: 24 cm
• Classification:
  • LCC : QD506
  • DC19 : 530.4/1
• Subject Headings:
  • LCSH : Surfaces (Technology) -- Analysis
  • LCSH : Thin films -- Analysis