Advances in X-ray analysis

著者

• Annual Conference on Applications on X-Ray Analysis
• Mueller, William M.

書誌事項

Advances in X-ray analysis

edited by William M. Mueller

Plenum Press, c1962-

• v. 17
• v. 18
• v. 19
• v. 20
• v. 21
• v. 22
• v. 23
• v. 24
• v. 25
• v. 26
• v. 27
• v. 28
• v. 29
• v. 30

注記

v. 16まで子書誌あり

v. 31からは別書誌<BA01581773>

v. 19 published by Kendall/Hunt

Proceedings of the ... Annual Conference on Applications of X-Ray Analysis

Vol. 17: edited by C. L. Grant ... [et al.]. -- Vol. 18: edited by William L. Pickles ... [et al.]. -- Vol. 19: edited by R. W. Gould ... [et al.]. -- Vol. 20: Howard F. McMurdie ... [et al.]. -- Vol. 21: edited by Charles S. Barrett ... [et al.]. -- Vol. 22: edited by Gregory J. McCarthy ... [et al.]. -- Vol. 23: edited by John R. Rhodes ... [et al.]. -- Vol. 24: edited by Deane K. Smith ... [et al.]. -- Vol. 26: edited by Camden R. Hubbard ... [et al.]. -- Vol. 27: edited by Jerome B. Cohen ... [et al.]. -- Vol. 28: edited by Charles S. Barrett, Paul K. Predecki, Donald E. Leyden. -- Vol. 29, 30: edited by Charles S. Barrett ... [et al.]

22nd-33rd, 35th : 1973-1984, 1986 : Denver, Colorado

34th : 1985 : Snowmass, Colorado

内容説明・目次

巻冊次

v. 17 ISBN 9780306381171

内容説明

The successful application of x-r~ diffraction techniques and x-r~ spectrometry depends in large measure on the availability of dependable standards and reference data. The preparation of such standards in the fields of metallurgy, geology, life sciences, and other disciplines is both costly and time consuming. As a result. the necessary standards for effective utilization of existing instrumentation are often not available. One of the purposes of the invited papers in this 22nd Annual Denver X-Ray Conference was tc review the status of programs to prepare such standards and reference data. Simultaneously, it seemed appropriate to examine the role of sampling both in terms of standards and samples to be analyzed. The first section of the invited papers focuses on the standards and reference data problems. In addition, many of the contributed papers offer information on this theme. The second topic in the invited papers consi- ders the problem of sampling. If we recognize that analyses are conducted on samples which vary in size from several grams to a few micrograms or less, the magnitude of the random and systematic error components of sam- pling on the quality of results should be obvious. Many of the contributed papers in such fields as air pollution and similar disciplines speak clear- ly to the difficulty of obtaining "representative" samples. The papers contained in this volume and the many lively discussions such as the panel discussion at the close of the first session of papers should stimulate further attention to this vital topic.

目次

Standard Reference Materials and Meaningful X-Ray Measurements.- Standard Reference Materials - Their Production and Use.- Standard Data for the Identification of Phases by X-Ray Diffraction.- Provision, Suitability and Stability of Standards for Quantitative Powder Diffractometry.- Influence of Sampling on the Quality of Analyses with Emphasis on Powders.- Variation of Standards and Sampling Requirements for Complementary Analysis Methods.- Quantitative Analysis of Clay Minerals in Drilling Mud Solids.- Factors Limiting the Use of Standard Minerals in the X-Ray Diffraction Analysis of Clays.- Role of Diffractometer Geometry in the Standardization of Polycrystalline Data.- A New X-Ray Diffraction Method for Quantitative Multicomponent Analysis.- The A1 Fe Be4 Intermetallic Phase in Beryllium.- High Speed Retained Austenite Analysis with an Energy Dispersive X-Ray Diffraction Technique.- Quantitative X-Ray Diffraction Phase Analysis of the Oxidation of Steel by a Direct Comparison Method.- Low Energy X-Ray and Electron Absorption within Solids (100-1500 eV Region).- X-Ray Fluorescence Analysis of Portland Cement Through the Use of Experimentally Determined Correction Factors.- Specimen Standards for X-Ray Spectrometric Analysis of Atmospheric Aerosols.- A Versatile X-Ray Fluorescence Method for the Analysis of Sulfur in Geologic Materials.- Sampling and Standards in a Recycled World.- X-Ray Cross-Sections in Design and Analysis of Non-Dispersive Systems.- Use of Multiple Standards for Absorption Correction and Quantitation with Frieda.- Resin-Loaded Papers - A Versatile Medium for Sampling and Standardization.- Chelating Ion Exchange Resins and X-Ray Fluorescence.- Can Regression Equations be Optimized by Finagling X-Ray Intensities.- X-Ray Fluorescence Analysis of High-Temperature Super-alloys - Calibration and Standards.- Quantification of Sub-microgram Elemental Concentrations Using Micro-dot Samples.- A Rapid Direct X-Ray Fluorescence Method for Simultaneously Determining Brass Composition and Plating Weight for Brass-Plated-Steel Tire Cord Wires.- Quantitative Nondispersive X-Ray Fluorescence Analysis of Highly Radioactive Samples for Uranium and Plutonium Concentration.- The Effects of Self-Irradiation on the Lattice of 23B(80%)puO2 III.- The Effects of X-Ray Optics on Residual Stress Measurements in Steel.- X-Ray Diffraction Residual Stress Analysis Using High Precision Centroid Shift Measurement Techniques - Application to Uranium - 0.75 Weight Percent Titanium Alloy.- An X-Ray Amorphous Scattering Investigation of the Corrosion of a Pottassium Silicate Glass K20-3Si02.- A Review of X-Ray Diffraction Methods for Diffusion Studies.- Pole Figure Random Intensity Calculation Using Powder Integrated Ratios.- X-Ray Emission from Laser-Produced Plasmas.- Calculation and Measurement of Integral Reflection Coefficient Versus Wavelength of "Real" Crystals on an Absolute Basis.- X-Ray Production Cross Sections for Ti, Co, Ge, Rb and Sn by MeV Oxygen Ion Bombardment.- Some Biomedical Applications of Charged-Particle-Induced X-Ray Fluorescence Analysis.- Qualitative Analysis of the Kossel Back Reflection Pattern from Selected Semiconductors.- An Experimental Evaluation of the Atomic Number Effect.- X-Ray Emission from Thin Film Materials.- Auger Electron Emission Micrography and Microanalysis of Solid Surfaces.- A Combined Photoelectron/X-Ray Fluorescence Spectrometer.- A Spherically Bent Crystal X-Ray Spectrometer with Variable Curvature.- Measurement of the X-Ray Sensitivity of Silicon Diodes in the Energy Region 1.8 to 5-0 KeV.- Development of the High Performance "Solfa" On-Line Analyser to Measure Total Sulphur in Petroleum Distillates and Residual Fuels Using Non-Dispersive X-Ray Fluorescence.- Automatic Data Acquisition and Reduction for Elemental Analysis of Aerosol Samples.- A Secondary-Source, Energy-Dispersive X-Ray Spectrometer and its Application to Quantitative Analytical Chemistry.- Author Index.

巻冊次

v. 18 ISBN 9780306381188

内容説明

In the past the Denver X-Ray Conference has served as a forum for the interchange of information between people working in the extremely varied applied technologies which are based on x-ray physics. This year we hoped to continue this tradition by empha- sizing some of the technologies associated with the energy and process control industries, which have expanded recently. The development of nuclear fusion into a power source, and the operation of the nuclear fission power reactor fuel cycle are two parts of the energy industry in which x-ray technology is currently playing a major role. The principle role of x-ray technology in the effort to develop a controlled thermonuclear or fusion power reactor, is that of a diagnostic tool to study the properties of high temperature plasmas. Since this subject is relatively new to many, it was reviewed in two of the invited papers. The role of x-ray technology in the nuclear fission reactor fuel cycle is primarily that of fluorescent x-ray analysis of reactor fuel materials for the purposes of process control and nuclear safeguards during fabrication and reprocessing. One of the invited papers reviewed this topic. This year the subject of x-ray lasers was also introduced via an invited paper. If an x-ray laser can be developed, it will probably become the center of many new technologies. The contributed papers this year covered x-ray diagnostics of plasmas, x-ray lasers, hardware and technique development for x-ray fluorescence analysis, atmospheric aerosol analysis, and materials characterization.

目次

X-Ray Emission from High-Temperature Laboratory Plasmas.- Instrumentation for X-Ray Diagnostics of Plasmas.- Determination of Actinide Elements in Nuclear Fuels by X-Ray Analysis.- Techniques of Low Energy X-Ray Spectroscopy (0.1 to 2 keV Region).- Nanosecond Time Resolved X-Ray Diagnostics of Relativistic Electron Beam Initiated Events.- Soft X-Ray Vacuum Ultraviolet Diagnostics of High Density, High Temperature Plasmas at the Air Force Weapons Laboratory.- Amplification of Soft X-Rays in a Picosecond Laser-Produced Plasma.- A Pinhole Camera for Photographing X-Rays from Laser-Produced Plasmas.- Sub-Kilovolt X-Ray Calibration of Photographic Film.- Spectral Analysis of X-Rays from Laser-Induced Plasmas.- X-Ray Diagnostics of Laser-Produced Plasmas Using CaF2(Dy) Thermoluminescent Dosimeters.- X-Ray Analysis for Electron Beam Enhancement in the Plasma Focus Device.- Subnanosecond X-Ray Measurements Using a Unitary Organic Crystal and Image Converter Streak Camera.- X-Ray Pulse Calorimetry of Laser-Produced Plasmas.- Silicon Detector System for X-Ray Pulse Calorimetry of Laser-Produced Plasmas.- The Use of Photographic and X-Ray Films for X-Ray Measurements.- Low Energy X-Ray Microradiography of Laser Fusion Targets.- Polarized Radiation for X-Ray Fluorescence Analysis.- On-Line X-Ray Measurement and Control of Silver Emulsion Coating Weight.- X-Ray Fluorescence Experiments with Polarized X-Rays.- X-Ray Fluorescence Analysis with Transmission Target Tubes.- Application of Heavy Charged Particle Induced X-Ray Emission to the Trace Element Analysis of Human Tissue and Blood Serum.- Proton Induced X-Ray Fluorescence Analysis Using a Cockcroft-Walton Accelerator.- A Computer Control for an X-Ray Fluorescence Analysis Unit.- X-Ray Fluorescence Analysis of Refractory Oxide Materials.- Quality Control through Determination of Interelement Effects in Iron-Gadolinium-Yttrium Solutions Using X-Ray Secondary Emission.- Investigation of Elemental Analysis of Water Samples by Radio-Alpha Induced X-Ray Emission Spectroscopy.- Charged Particle Induced X-Ray Analysis of Malaria Infected Blood.- Non-Linear Least Squares Analysis of Proton-Induced X-Ray Emission Data.- The Computer Calculation, from Fundamental Parameters, of Influence Coefficients for X-Ray Spectrometry.- Use of Calculated Alpha-Coefficients in Quantitative X-Ray Spectrometry.- Math Model Design for X-Ray Analysis of Iron Base Alloys.- A Multiple Regression Procedure for Elemental Analysis at Low Concentrations.- Chemical State Analyses of Sulfur, Chromium, and Tin by High Resolution X-Ray Spectrometry.- Excitation-Energy-Dependent Resonances in Soft X-Ray Appearance Potential Spectra of the Cerium 4d- and 3d-Electron Levels.- A High Intensity, Monochromatic, Spatially Coherent X-Ray Source.- Measurement of Anisotropic Compressibilities by a Single Crystal Diffractometer Method.- The Pseudo-Kossel Technique in Back Reflection as a Tool for Measuring Strains.- Anomalies in Measurement of Residual Stress by X-Ray Diffraction.- X-Ray Analysis of Ti3Al Precipitation in Ti-Al Alloys.- Crystallite Orientation Analysis from Incomplete Pole Figures.- An X-Ray Diffraction Study of Triglyceride Polymorphism.- Bone Mineral (Apatite) Assay by Photon Scattering - A Survey of Sources and Experimental Evaluation.- Semi-Quantitative Determination of Asbestiform Amphibole Mineral Concentrations in Western Lake Superior Water Samples.- Environmental Monitoring Device for X-Ray Determination of Atmospheric Chlorine, Reactive Sulfur and Sulfur Dioxide.- Energy, Aerosols and Ion-Excited X-Ray Emission.- Application of Proton Induced X-Ray Emission Analysis to the St. Louis Regional Air Pollution Study.- Proton Elastic Scattering Analysis - A Complement to Proton Induced X-Ray Emission Analysis of Aerosols.- Microprobe Analysis of Soil Erosion Aerosols.- Self Absorption Corrections for X-Ray Fluorescence Analysis of Aerosols.- Author Index.

巻冊次

v. 20 ISBN 9780306381201

内容説明

X-ray diffraction as a method of qualitative analysis for crystal- line phases has been long accepted, and has had constant improvement in method and equipment. It has also been made more useful by the growth and improvement of the data collection available as reference standards. In recent years some attempts have been made to use the method to a greater extent by furnishing results on a quantitative basis. This has proved to be difficult because of the problem of comparing the relative intensities of the diffraction peaks from one phase to another. This year the initial session of invited papers focuses primarily on this problem. The subject is approached both by the use of internal comparison standards and by calculation of intensities. In addition, the identification of crystalline phases by X-ray diffraction of single crystals is discussed in an invited paper. This method, with its advantages of the use of very small samples, is becoming increasingly feasible because of the development of simple equipment and the avail- ability of a growing data bank. Other X-ray diffraction developments discussed at the Conference include stress analysis, use of computers for searching the JCPDS powder diffraction file, texture analysis, and applications to specific fields. Spectroscopy topics covered at the conference included a discussion of methods of concentration of materials for fluorescence analysis, soft X-ray spectra, and equipment for fluorescence analysis.

目次

X-ray Powder Diffraction.- Forty Years of Quantitative Diffraction Analysis.- Quantitative Matching of Powder Diffraction Patterns.- Experimental and Calculated Standards for Quantitative Analysis by Powder Diffraction.- X-ray Diffraction Examination of the Phases in Expansive Cements.- The Single Crystal vs. The Powder Method for Identification of Crystalline Materials.- Phase Identification by X-ray Powder Diffraction Evaluation of Various Techniques.- Chemical Identification and Phase Analysis of Transplutonium Elements and Compounds via X-ray Powder Diffraction.- X-ray Diffraction Examination of Coal Combustion Products Related to Boiler Tube Fouling and Slagging.- Computer Identification Techniques for Crystalline Compounds Using the JCPDS Powder Diffraction File as a Data Reference.- Computer Searching of the JCPDS Powder Diffraction File.- A Round Robin Test to Evaluate Computer Search/Match Methods for Qualitative Powder Diffractometry.- Direct Quantitative Determination of Silica by X-ray Diffraction on PVC Membrane Filters.- Internal Standard and Dilution Analyses Applied to the Kinetics of TiB Formation.- The Effect of the K? Doublet Diffracted Peak Position on the Precision of the Lattice Constant.- Energy Dispersive X-ray Diffractometry.- A New Method for the Determination of the Texture of Materials of Cubic Structure from Incomplete Reflection Pole Figures.- X-ray Topography.- Crystal Subgrain Misorientations via X-ray Diffraction Microscopy.- Some Topographic Observations of the Effects of Dynamical Diffraction in Imperfect Metal Crystals.- Direct Display of X-ray Topographic Images.- Characterization of Strain Distribution and Annealing Response in Deformed Silicon Crystals.- Crystal Imperfections and Magnetic Domain Walls in Thick Czochralski-Grown Nickel Single Crystals.- X-ray Diffraction Stress Analysis.- Some Problems in X-ray Stress Measurements.- Stress Measurements in Thin Films Deposited on Single Crystal Substrates Through X-ray Topography Techniques.- Location of Diffractometer Profiles in X-ray Stress Analysis.- Study of the Precision of X-ray Stress Analysis.- The Effect of Temperature and Load Cycling on the Relaxation of Residual Stresses.- Stress Measurements on Cold-Worked Fastener Holds.- Diffraction Technique For Stress Measurement In Polymeric Materials.- X-ray Diffraction Studies Of Shocked Lunar Analogs.- A Method of Determining the Elastic Properties of Alloys in Selected Crystallographic Directions for X-ray Diffraction Residual Stress Measurement.- The Need for Experimentally Determined X-ray Elastic Constants.- A Modified Diffractometer for X-ray Stress Measurements.- A Dual Detector Diffractometer for Measurement of Residual Stress.- X-ray Residual Stress Measurements Using Parallel Beam Optics.- X-ray Fluorescence.- Proton-Induced X-ray Emission Analysis of Human Autopsy Tissues.- Polymer Films as Calibration Standards for X-ray Fluorescence Analysis.- Chemical Analysis of Nickel Ores by Energy Dispersive X-ray Fluorescence.- Determination of Sulfur, ASH, and Trace Element Content of Coal, Coke, and Fly ASH Using Multielement Tube-Excited X-ray Fluorescence Analysis.- Advances in the Preconcentration of Dissolved Ions in Water Samples.- Concentration of U and Np from Pu and Pu Alloys for Determination by X-ray Fluorescence.- Preconcentration of Uranium in Natural Waters for X-ray Fluorescence Analysis.- "Loss on Ignition" in Fused Glass Buttons.- Measurement of "Chemical Shift" by an Automated Commercial X-ray Fluorescence Spectrometer.- Low Energy Mass Absorption Coefficients from Proton Induced X-ray Spectroscopy.- Processing of Energy Dispersive X-ray Spectra.- Use of X-ray Scattering in Absorption Corrections for X-ray Fluorescence Analysis of Aerosol Loaded Filters.- An Interactive Program for the Control of the X-ray Spectrometer, for Data Collection and Data Manipulation - Use in Qualitative Analysis.- Lama I - a General Fortran Program for Quantitative X-ray Fluorescence Analysis.- X-ray Instrumentation.- A Novel X-ray Powder Diffractometer Detector System.- Counting Rate Performance of Pulsed-Tube Systems.- A New Method for the Elimination of the Wall Effect in Proportional Counter.- X-ray Intensities from Copper-Target Diffraction Tubes.- Polarized Radiation Produced by Scatter for Energy Dispersive X-ray Fluorescence Trace Analysis.- Author Index.

巻冊次

v. 21 ISBN 9780306384219

内容説明

X-ray methods applied to the characterization of substances of scientific and industrial interest continue to expand. The Denver Conference on Applications of X-Ray Analysis provides the forum by which developments in techniques, instrumentation and applications are communicated to those who have interest in X-ray methods. In recent years, a trend has developed for the conference to alternate emphasis annually between X-ray diffraction and X-ray spectrometry, yet provide a quality program in each area every year. The conference held August 3-5, 1977, followed this trend. The invited papers in the opening session represent a broader scope than the usual classification. The use of X-ray photons as an energy source for the excitation of optical emission was pre- sented. The application of such techniques to selected lanthanides has been known for several years. However, V. A. Fassel presented new results in which X-rays were used to excite optical emission from aromatic organic compounds. The potential for X-ray laser applications is great. R. C. Elton gave an excellent review of the state of the art and recent advances in X-ray laser research. The results indicate that X-ray lasers are in the future, perhaps not the near future.

目次

X-Ray Techniques in Chemical Analysis.- Recent Advances in X-Ray Laser Research.- Interdependence of X-Ray Diffraction and X-Ray Fluorescence Data.- Applications of X-Ray Spectrometry in Metals and Mining.- Analysis of Agglomerate and Slag by Energy Dispersive X-Ray Fluorescence (Note).- X.R.F. Analysis of Steelmaking Slags Using Special Sample Preparation Techniques.- Spectrochemistry in the Iron Foundry: X-Ray Fluorescence VS. Optical Emission.- Reliability of Energy Dispersive X-Ray Fluorescence Analysis of Low-Alloy Steels.- X-Ray Fluorescence Capabilities for Uranium Ore Analysis.- Determination of Uranium in Carbonate Solutions by Extraction Onto a Chemically Modified Surface.- Energy Dispersive XRF Analyses of Bauxites (Note).- X-Ray Fluorescence Minor- and Trace-Element Analyses of Silicate Rocks in the Presence of Large Interelement Effects.- Standardless Thickness Measurement of Steel Coatings by X-Ray Fluorescence Spectrometry (Note).- An X-Ray Fluorescence Coating Gauge for Paint Thickness.- Calculations and Parameters in X-Ray Spectrometry and Absorptiometry.- Excitation Efficiencies for K and L X-Ray Fluorescence by a Mo Transmission Tube.- Calculation of X-Ray Fluorescence Cross Sections for K and L Shells.- Adaptation of the Fundamental Parameters Monte Carlo Simulation to Edxrf Analysis with Secondary Fluorescer X-Ray Machines.- Method of Measurement of Mean Concentration for an Element Segregated in Layers by X-Ray Analysis (Note).- A New Device for the Precise Measurement of X-Ray Attenuation Coefficients and Dispersion Corrections (Note).- Errors in Dual X-Ray Beam Differential Absorptiometry.- X-Ray Fluorescence Instrumentation and Application Considerations.- X-Ray Fluorescence Analysis Applied to Small Samples.- On Energy Dispersive Properties of the Proportional Counter Channel.- A Radioisotope on-Stream Analyzer for the Mining Industry.- A Theoretical Study of the Effects of Dead Layers on Low Energy X-Ray Detectors.- Evaluation of Pulse Pileup Rejection (Note).- Getting Accurate Intensity Values from Energy Dispersive X-Ray Spectra Using Fixed Energy Windows.- Verification of Stability and Precision for Energy-Dispersive XRF Systems.- Frequency Shift of L-Valence Band Spectra of Niobium and Tin in Nb3Sn Compound (Note).- Proton Induced X-Ray Emission Analysis.- The Relevance of Proton Induced X-Ray Analysis to the Study of Separate Mineral Phases.- Elemental Analysis of Biomedical Samples by Pixe (Note).- X-Ray Powder Diffraction.- USE of Automated X-Ray Diffraction Analysis in Studies of Natural Hydrothermal Systems.- Qualitative Analysis of Complicated Mixtures by Profile Fitting X-Ray Diffractometer Patterns.- Optimal Calibration Curves for Guinier-Type Focusing Cameras.- Measuring Triaxial Stresses in Embedded Particles by Diffraction (Note).- A Versatile Position Sensitive X-Ray Detector.- Author Index.

巻冊次

v. 22 ISBN 9780306401633

内容説明

Many of the science and engineering problems under investiga- tion at industry, government and university laboratories come under the headings "energy, materials and resources." X-ray analysis plays a key role in these investigations. This is reflected in the content of the present volume of Advances in X-ray Analysis. Nearly half of the papers come under such headings as energy production and conversion, materials optimization and mineral characterization. The remainder continue the long tradition of this series in pre- senting the latest advances in apparatus and procedures for x-ray diffraction and fluorescence analyses. In keeping with recent practice, this year's Denver Conference on Applications of X-ray Analysis emphasized x-ray diffraction and was co-sponsored by JCPDS, International Center for Diffraction Data. The first group of papers in this volume were presented in a plenary session on unusual specimen preparation, handling and analy- ses by x-ray diffraction. In the lead paper, D. K. Smith and C. S. Barrett combine their seven decades of experience with surveys of diffractionists throughout the world to present a comprehensive re- view of non-routine specimen preparation in powder diffractometry. Next, M. J. Camp discusses the particular procedures and constraints under which foresnic laboratories employ diffraction methods. F. A. Mauer and C. R. Robbins discuss a method for characteri- zation of high temperature-pressure reactions in situ by energy dis- persive x-ray diffraction that offers the promise of sorting out the mechanisms underlying materials compatibility and durability.

目次

Special Techniques in Powder Diffraction.- Special Handling Problems in X-Ray Diffractometry.- Special Problems in Forensic Materials Analysis by XRD.- X-Ray Powder Diffraction Measurements in Reactive Atmospheres at 1000 C and 7 MPa (1000 psig).- X-Ray Diffraction of Radioactive Materials.- Characterization of Thin Films by X-Ray Fluorescence and Diffraction Analysis.- Characterization of Laterites By X-Ray Techniques.- Minimization of Preferred Orientation in Powders by Spray Drying.- Low Temperature X-Ray Diffractometer with Closed Cycle Refrigeration System.- X-Ray Powder Diffraction of Einsteinium Compounds.- Evaluation of XRD Patterns.- Identification of Multiphase Unknowns by Computer Methods: Role of Chemical Information, the Quality of X-Ray Powder Data and Subfiles.- The Control and Processing of Data from an Automated X-Ray Powder Diffractometer.- A Preliminary Report on the Design and Results of the Second Round Robin to Evaluate Search/Match Methods for Qualitative Powder Diffractometry.- Application of Guinier Camera, Microcomputer Controlled Film Densitometry, and Pattern Search-Match Procedures to Rapid Routine X-Ray Powder Diffraction Analysis.- Computer Automation of X-Ray Powder Diffraction.- A Microcomputer Controlled Diffractometer.- Applications of XRD.- X-Ray Powder Diffraction Investigation of the Monumental Stone of the Castel dell'ovo, Naples, Italy.- Quantitative Phase Analysis of Devonian Shales by Computer Controlled X-Ray Diffraction of Spray Dried Samples.- X-Ray Diffraction Studies of Stabilities of Zeolites to Temperature Changes and Solution Treatment.- Applications of the Gandolfi X-Ray Camera in Minerals Industry Research.- Instrumental Techniques for the Analysis of Paper Fillers and Pigments.- Investigations of Detection Threshold Variation and Microcrystallite Nucleation in Nuclear Track Detectors Using Small Angle X-Ray Analysis.- Application of Microbeam X-Ray Techniques to the Evaluation of The Plastic Zone Size of Fatigued Steels.- Residual Stress at Fatigue Fracture Surface of Heat Treated High Strength Steels.- Study on X-Ray Stress Analysis Using a New Position-Sensitive Proportional Counter.- Comparison of Stress Measurements by X-Rays with Three Different Detectors and a Strongly Fluorescing Specimen.- Use of Cr K-Beta X-Rays and Position Sensitive Detector for Residual Stress Measurement in Stainless Steel Pipe (Note).- Instrumentation and Laser Sources.- A Diffractometer Based Energy Dispersive Elemental Analyser (Note).- A New Method for Fast XRPD Using A Position Sensitive Detector.- Laser-Produced Plasmas as an Alternative X-Ray Source for Synchrotron Radiation Research and for Microradiography.- Mathematical Data Analysis for XRF.- A Review of Empirical Influence Coefficient Methods in X-Ray Spectrometry.- Quasi-Fundamental Correction Methods Using Broadband X-Ray Excitation.- Progress in X-Ray Fluorescence Correction Methods Using Scattered Radiation.- Development of the Detector Response Function Approach for the Library Least-Squares Analysis of Energy-Dispersive X-Ray Fluorescence Spectra.- X-Ray Fluorescence Analysis of Stainless Steels and Low Alloy Steels Using Secondary Targets and the Exact Program.- The Resolution of X-Ray Fluorescence Spectra by the Least Squares Method.- The Reduction of Matrix Effects in X-Ray Fluorescence Analysis by the Monte Carlo, Fundamental Parameters Method.- 'Pareds'-An Interactive on-Line System for the Interpretation of EDXRF Data.- Variation in Intensity Ratios Used to Identify Asbestos Fibers.- Use of a New Versatile Interactive Regression Analysis Program for X-Ray Fluorescence Analysis.- Modelling Intensity and Concentration in Energy Dispersive X-Ray Fluorescence.- XRF Applications.- Quantitative Analysis of 300 And 400 Series Stainless Steel by Energy Dispersive X-Ray Fluorescence.- Energy-Dispersive X-Ray Analysis for Carbon on and in Steels.- Determination of Solids Content in Slurries by X-Ray Scattering.- Developments in the Use of X-Rays in Body Composition Analysis.- XRF: Innovations.- Using Dec Operating System RSX-11M for X-Ray Diffraction and X-Ray Fluorescence Analysis.- Automated Determination of Optimum Excitation Conditions for Single and Multielement Analysis with Energy Dispersive X-Ray Fluorescence Spectrometry.- Improved X-Ray Fluorescence Capabilities by Excitation with High Intensity Polarized X-Rays.- A New X-Ray Spectroscopy Concept: Room Temperature Mercuric Iodide with Peltier-Cooled Preamplification.- Some Studies of Chlorinated Poly(Vinyl Chloride) using X-Ray Photoelectron Spectroscopy.- Contributor Index.

巻冊次

v. 23 ISBN 9780306404351

内容説明

Traditionally the emphasis at each annual Denver X-ray Con­ ference is placed on a particular aspect of X-ray analysis. The past decade has seen a steady expansion of applications of port­ able X-ray analyzers and probes in the field, in boreholes and in plant process streams. With this in mind, the main theme of the current conference is field applications of X-ray fluorescence with particular reference to analysis of raw materials such as rocks, ores and coal. The Plenary Session took up this theme with two invited papers reviewing applications of X-ray emission techniques to geochemical, borehole and on-stream analysis, and recent developments in port­ able instruments for alloy, ore and other analyses. The third paper took us further afield with a review of X-ray spectrochemical analy­ sis on Mars, the Moon and Earth. It is evident that portable X-ray analyzers are finding more and more applications outside the conventional boundaries of X-ray spectrometry. Users are not analysts and sometimes not even scien­ tists. Until recently this trend has been hindered by the "scien­ tific nature" of the instruments; one needs to understand XRF meth­ ods in order to properly operate the instrument. Microprocessor technology has made possible the development of precalibrated, "smart" analyzers with readouts in quantities familiar to the user and interlocks to prevent erroneous operation. Further developments along these lines were reported at this conference.

目次

XRF Applications in the Minerals Industry.- Some Applications of Energy Dispersive X-Ray Fluorescence Analysis in Minerals Exploration, Mining and Process Control.- Analysis of Magnesium Brines by Energy Dispersive XRF.- Portable X-Ray Fluorescence Analyzers and Their Use in an Underground Exploration Program for Tin.- Applications of a New Multielement Portable X-Ray Spectrometer to Materials Analysis.- In Situ Rock Analysis.- Rapid Determination of Ash in Coal By Compton Scattering, Ca And Fe X-Ray Fluorescence.- On Site Determination of Ash in Coal Utilizing a Portable XRF Analyzer.- Routine Energy Dispersive Analysis of Sulfur in Coal.- Application of the Fundamental Parameters Model to Energy-Dispersive X-Ray Fluorescence Analysis of Complex Silicates.- Elemental Analysis of Uraniferous Rocks and Ores By X-Ray Spectrometry.- The Fast Analysis of Uranium Ore by EDXRF.- Mathematical Methods in XRF.- A Comprehensive Alpha Coefficient Algorithm.- Fundamental-Parameters Calculations on a Laboratory Microcomputer.- Modified NRLXRF Program for Energy Dispersive X-Ray Fluorescence Analysis.- Unusual Matrix Fluorescence Effects in X-Ray Fluorescence Analysis.- Monte Carlo Simulation of Sample Scattering Effects from Homogeneous Samples Excited by Monoenergetic Photons.- The Application of Digital Filters to the Analysis of Ge And Si (Li) Detector X-Ray Spectra.- XRF Applications in Environmental Analysis.- X-Ray Spectrometric Determination of Sulfate in Natural Waters.- Application of the Pixe Method in Atmospheric Aerosol Investigations.- Computer Code for Analyzing X-Ray Fluorescence Spectra of Airborne Particulate Matter.- Other XRF Applications.- Energy Dispersive X-Ray Fluorescence (EDXRF) Analysis As A Reliable Nondestructive Industrial Tool.- Nondestructive, Energy-Dispersive, X-Ray Fluorescence Analysis Of Actinide Stream Concentrations from Reprocessed Nuclear Fuel.- Direct Determination of Niobium in Uranium-Niobium Alloys.- In Vivo X-Ray Fluorescence Analysis for Medical Diagnosis.- Effect of Chemical State Upon Phosphorus-L2,3 Fluorescence Spectra.- X-Ray Study of the Band Structure in Stannic Oxide.- Energy Dispersive XRF Composition Profiling Using Crystal Collimated Incident Radiation.- Energy Dispersive X-Ray Fluorescence Analysis of Inks on Paper.- Determination of the Thickness of Si02-Layers on Si by X-Ray Analysis and by X-Ray Photoelectron Spectroscopy..- XRF: Techniques and Instrumentation.- The Effective Use of Filters with Direct Excitation of EDXRF.- A Plasma Controlled X-Ray Tube.- X-Ray Fluorescence Analysis at Room Temperature with an Energy Dispersive Mercuric Iodide Spectrometer.- New Mold Design for Casting Fused Samples.- X-Ray Imaging.- Use of Computers in Powder Diffraction.- The Search-Match Problem.- A Computer Aided Search/Match System for Qualitative Powder Diffractometry.- A Second Derivative Algorithm for Identification of Peaks in Powder Diffraction Patterns.- Advances in the Computer Indexing of Powder Patterns.- Specplot—An Interactive Data Reduction and Display Program for Spectral Data.- A Minicomputer and Methodology for X-Ray Analysis.- X-Ray Diffraction Stress (Strain) Determination.- Fracture Surface Analysis of Ball Bearing Steel By X-Ray Residual Stress Measurement.- A Position-Sensitive Proportional Counter for Residual Stress Measurement by Means of Microbeam X-Rays.- Stress Analysts in Graphite/Epoxy.- Problems Associated with K? Doublet in Residual Stress Measurements.- Inclination of Principal Residual Stress and the Direction of Cracking in Contact-Fatigued Ball Bearing Steel.-X-Ray Diffraction in Materials Analysis.- The Generalization and Refinement of the Vector Method for the Texture Analysis of Polycrystalline Baterials.- The Fitting of Powder Diffraction Profiles to an Analytical Expression and the Influence of Line Broadening Factors.- Quantitative Phase Analysis of Synthetic Silicon Nitride by X-Ray Diffraction.- Author Index.

巻冊次

v. 24 ISBN 9780306407345

内容説明

Deane K. Smith Department of Geosciences The Pennsylvania State University Computer automation of x-ray powder diffraction has been one of the dominant topics of this conference for many years. In fact, the first description of such instrumentation dates back to 1967, Rex (1). The modern instruments are considerably more sophisticated than this early unit, but the goals of automation are essentially unchanged. They are to obtain better data at a faster rate with less effort than is possible with manual instrumentation. Indeed "laziness is the mother of invention. " The emphasis of most of the papers on automation has been tm-lard hardware-controlling systems and aC,"lieving accurate d values and good intensities for effective phase identification and phase characterization. Tests of good data include successful pattern searching and matching. Indexing by computer methods or accurate lattice parameters through least-squares fitting procedures with resulting small residuals is a good test of d value accuracy. Intensity accuracy is much harder to test unless a theoretical data set is available. In most of the reported studies, the emphasis has been more on the data acquisition than on the specific problems to which the data is to be applied. In organizing this plenary session, an attempt was made to focus on applications, especially those which are at the forefront of materials studies. In addition many other applications papers were encouraged with the result that a good variety of such topics are included in the program this year.

目次

Practical Applications of Automated Analysis of Diffraction Data.- Application of the Rietveld Method for Structure Refinement with Powder Diffraction Data.- Crystallinity, Crystallite Size and Lattice Perfection in Fibrous Polymers.- Quantitative Analysis of Dust Samples from Occupational Environments Using Computerautomated X-Ray Diffraction.- Porotectosilicate Structure Determination from Model Building.- Analysis and Interpretation of Diffraction Data from Amorphous Materials.- XRD Mathematical Methods, Techniques and Instrumentation.- X-Ray Powder Diffraction in Europe.- A Hanawalt Type Phase Identification Procedure for a Minicomputer.- Qualitative Phase Analysis Using an X-Ray Powder Diffractometer.- NBS*AIDS80: A Fortran Program to Evaluate Crystallographic Data.- Reproducibility and Precision of Measurements of Guinier Powder Patterns Using Powdered Silicon Calibrant.- An Approach to the Automation of a Multifunction X-Ray Diffraction Laboratory.- XRD Applications of Position Sensitive Detectors, X-Ray Strain Measurement, Fatigue Characterization.- The Use and Accuracy of Continuously Scanning Position-Sensitive Detector Data in X-Ray Powder Diffraction.- A New Model of X-Ray Position Sensitive Detector Developed in France.- Use of a Position Sensitive Detector.- A Versatile X-Ray Stress Analyzer Using a Position Sensitive Detector.- Integral Type, Position-Sensitive Proportional Chamber with Multiplexer Readout System for X-Ray Diffraction Experiments.- An Area-Imaging Proportional Counter for X-Ray Diffraction.- Stress Measurement in Stainless Steel by Use of Monochromatic Cr-K? X-Rays and a Position Sensitive Detector.- A High-Speed Signal Processor Using a Digital Divider for Position Sensitive Proportional Counters.- X-Ray Spectrometer for EXAFS Using a Position Sensitive Detector.- X-Ray Stress Measurements in Ground Surface of Steel by Position Sensitive Detector.- Time-Resolved X-Ray Powder Diffractometry Using Linear Position-Sensitive Proportional Counters.- Technical Feasibility of a Borehole Probe for in-Situ X-Ray Diffraction Analysis.- Measurement of Cumulative Fatigue Damage by X-Ray Double-Crystal and Scanning Diffraction Methods.- An X-Ray Study of Ion-Implanted Liquid Phase Epitaxial Garnet Films with a Single Crystal Diffractometer.- Residual Stress Change Due to Rolling Contact of Ball and Roller Bearings.- Compression and Compressibility Studies of Plutonium and a Plutonium-Gallium Alloy.- X-Ray Diffraction Evaluation of Adhesive Bonds and Stress Measurement with Diffracting Paint.- Other XRD Applications.- Separation of Broad Crystalline and Amorphous X-Ray Diffraction Peaks.- Energy-Dispersive Diffraction Analysis of the Structure of Metallic Glasses.- Internal Standards for Quantitative X-Ray Phase Analysis: Crystallinity and Solid Solution.- Application of Gandolfi X-Ray Diffraction to the Characterization of Reaction Products from the Alteration of Simulated Nuclear Wastes.- The Characterization of Alpha and Intermediate Aluminum Oxide Mixtures by Semi-Automated XRD.- Experimental Evaluation of Peak Height Approximation for X-Ray Diffracted Integrated Intensity Method.- The Application of an Automated Single Crystal Orienter for Large Specimens.- XRF Applications in the Minerals Industry.- On Stream Analysis of Lead and Zinc Ore Fractions Using Energy Dispersive and Wavelength Dispersive Techniques.- On-Stream Analysis of Float Process Slurries by XRF.- X-Ray Fluorescence Analysis of High Z Materials with Mercuric Iodide Room Temperature Detectors.- Applicability of U L X-Ray Lines for the Determination of Low Uranium Concentrations.- Applicability of PIXE and XRF to Fast Drill Core Analysis in Air.- Use of Compton Scattering in X-Ray Fluorescence for Determination of Ash in Indian Coal.- XRF Techniques and Instrumentation.- The Present State of X-Ray Spectrometry.- Improving the Detection Limit in Wavelength Dispersive XRF.- Background and Sensitivity Considerations of X-Ray Fluorescence Analysis with a Room-Temperature Mercuric Iodide Spectrometer.- Multiple Scattering and the Polarization of X-Rays.- Advances in Low-Energy Electron-Induced X-Ray Spectroscopy (LEEIXS).- Escape Peak Intensities in Argon/Methane Flow Detectors.- Leveling Device for Forming X-Ray Specimen.- Other XRF Applications and Mathematical Methods.- Monte Carlo Determinations of Optimal Photon Energies for XRF Analysis of Iodine in Vivo.- Lead and Barium in Archaeological Roman Skeletons Measured by Nondestructive X-Ray Fluorescence Analysis.- Analysis of Refractory Metals and WC-Based Hard Metals by Energy Dispersive X-Ray Fluorescence.- An Improved Sample Preparation and Analysis Technique for the Determination of Minor Elements in Catalytic Materials by Radioisotope Induced X-Ray Fluorescence.- Glass and Glass Raw Materials Analysis Using a Philips PW1600 Wavelength Dispersive X-Ray Spectrometer.- A General Method of Blank Subtraction for Quantitative X-Ray Fluorescence Intensity Measurements.- A Rapid and Precise Computer Method for Qualitative X-Ray Fluorescence Analysis.- Monte Carlo Studies on the Design of Radioisotope Source Holders and Shields for EDXRF Analyzers.- Author Ikndex.

巻冊次

v. 25 ISBN 9780306410086

内容説明

In alternating years, the Denver X-ray Conference turns its principal attention, through the choice of subjects for the plenary lectures, to various aspects of either X-ray fluorescence or dif- fraction. This is a "fluorescence" year, and the three invited lecturers are experts in techniques that are at, or perhaps yet a bit beyond, the forefront of our understanding and technology in that field. The common denominator in selecting these subjects was that each is approaching a full elucidation of theory, and active develop- ment of practical hardware, and that each presents analytical pos- sibilities which can hardly be ignored in the next generation of commercial instrumentation. In other words, these are techniques that many of us shall likely find ourselves using by the end of the decade. The greatest difficulty in selecting the subjects was the need to overlook others, particularly 1) the increasing inter- est in "in-situ" or on-line analytical control, for tagging, identi- fication or sorting; and 2) the broad subject of the computeriza- tion of instrumentation, with its powerful impact on the design of hardware, and its open invitation to the theorist to create more exact mathematical models of the analytical process, regardless of complexity, in the expectation that programmers will find ways to implement solutions in affordable, dedicated computers.

目次

I. XRF Detectors and XRF Instrumentation.- Solid-State Room-Temperature Energy Dispersive X-Ray Detectors.- Preliminary Study of the Behavior of HPGe Detectors with Ion Implanted Contacts in the Ultralow-Energy X-Ray Region.- Performance of Room-Temperature X-Ray Detectors Made from Mercuric Iodide (HgI2) Platelets.- The Gas Proportional Scintillation Counter as a Room Temperature Detector for Energy Dispersive X-Ray Fluorescence Analysis.- Performance Characteristics of a High Resolution Si(Li) Detector Using a Time Variant Amplifier and a Pulsed Source of X-Rays.- X-Ray Tubes for Energy Dispersive XRF Spectrometry.- Toroidal Monochromators in Hybrid XRF System Improve Effectiveness of EDXRF Ten Fold.- II. XRF Methods: Practical, Mathematical.- The Use of Polarized X-Rays for Improved Detection Limits in Energy Dispersive X-Ray Spectrometry.- X-Ray Fluorescence of Intermediate-to High-Atotaic-Number Elements Using Polarized X Rays.- Examples of Analysis from an Integrated X-Ray Fluorescence Analysis System Using NRLXRF.- A Modular ADC/Microcomputer System for Energy Dispersive X-Ray Spectroscopy.- Volatilization,of Sulfur in Fusion Techniques for Preparation of Discs for X-Ray Fluorescence Analysis.- Techniques for the Preparation of Lithium Tetraborate Fused Single and Multielement Standards.- III. XRF Applications: Mineral and Geological.- The Use of EDXRF for Liquids in a Uranium-Vanadium Solvent Extraction Process.- A Resin-Loaded Paper X-Ray Fluorescence Method for Determining Uranium in Phosphate Materials.- The X-Ray Analysis of Uranium Ores for Iron Sulfide Minerals.- A Statistical Comparison of Data Obtained from Pressed Disk and Fused Bead Preparation Techniques for Geological Samples.- Trace and Minor Element Analysis of Obsidian from the San Francisco Volcanic Field Using X-Ray Fluorescence.- Quantitative Determination of Ga, Zn, Cu, Ni, Mn, and Cr by X-Ray Fluorescence in Laterites and Bauxites Using Two Evaluation Methods.- A Combined Dilution and Line-Overlan Coefficient Solution for the Determination of Rare Earths in Monazite Concentrates.- Feasibility Study for On-Stream X-Ray Analysis of Barite.- IV. XRF Applications. Metals, Catalysts, Oils.- "Standard-Background" Method of X-Ray Spectral Analysis for Quality Control of Noble Metals in Alumina-Based Automobile Exhaust Catalysts.- Some Elemental Determinations of Catalytic Materials Using a Thin-Film Internal Standard Technique by Radioisotope Excited X-Ray Fluorescence.- Energy Dispersive X-Ray Measurements for Cesium and Silver in Zeolite Ion-Exchange Columns.- Direct Analysis of Plutonium Metal for Gallium, Iron and Nickel by Energy Dispersive X-Ray Spectrometry.- The Analysis of Copner Alloys by Chem-X, Low Power F?DX Multichannel Spectrometer.- Energy Dispersive XRF Analysis of Lubricating Oil Additives with Secondary Target Excitation and the EXACT Fundamental Parameters Program.- The Analysis of Oil Additives Using Fundamental Influence Coefficients.- V. XRF Environmental Applications.- The Measurement of Low Concentrations of Organic and Inorganic Gaseous Contaminants in Occupational Environments by X-Ray Spectrometry (XRS).- The Application of X-Ray Fluorescence and Diffraction to the Characterization of Environmental Assessment Samples.- Accurate PIXE Analysis of Thin Samples, Aerosol Loaded Filters and Surface Layers of Thick Samples.- Energy Dispersive Analysis of Actinides, Lanthanides, and Other Elements in Soil and Sediment Samples.- X-Ray Fluorescence Analysis of Welding Fume Particles.- VI. XRD Search/Match Procedures and Automation.- A New Computer Algorithm for Qualitative X-Ray Powder Diffraction Analysis.- A Versatile Minicomputer X-Ray Search/Match System.- Automatically Correcting for Specimen Displacement Error During XRD Search/Match Identification.- X-Ray Diffraction Phase Analysis Using Microcomputers.- A Second Generation Automated Powder Diffractometer Control System.- Application of the Modified Snyder's Program for the Data Processing of an Automated X-Ray Powder Diffractometer.- INDEX, A Program to Reconcile Powder Diffractograms.- IDENT - A Versatile Microfile-Based System for Fast Interactive XRPD Phase Analysis.- VII. XRD Methods and Instrumentation.- Complete Quantitative Analysis Using Both X-Ray Fluorescence and X-Ray Diffraction.- Calibration of the Diffractometer at Low Values of Two Theta.- Schreiner Sample Preparation and Methodology for X-Ray Quantitative Analysis of Thin Aerosol Layers Deposited on Glass Fiber and Membrane Filters.- Differential X-Ray Diffraction by Wavelength Variation: A Preliminary Investigation.- X-Ray Diffraction Quantitative Analysis Using Intensity Ratios and External Standards.- A Guinier Diffractometer with a Scanning Position Sensitive Detector.- Observation of an X-Ray Beam of 10 Microradian Divergence Without Using Any Collimator.- VIII. XRD Applications.- X-Ray Residual Stress Mapping in Industrial Materials by Energy Dispersive Diffractometry.- Stress Measurement and Precision Diffraction Angles on Large Grained Specimens.- Determination of Residual Stresses in Austenite and Martensite in Case-Hardened Steels by the Sin2? Method.- X-Ray Characteristics and Applications of Layered Synthetic Microstructures.- The Use of Energy Dispersive Diffractometry to Measgre the Thickness of Metal and Glass Thin Films.- Application of Automated X-Ray Diffraction to Alteration Mineral Zoning Studies.- The Application of X-Ray Diffraction for Glass Batch Homogeneity Determination.- X-Ray Diffraction and Fluorescence in the Analysis of Pharmaceutical Excipients.- Corrections to Volume 24..- Author Index.

巻冊次

v. 26 ISBN 9780306413704

内容説明

At the Denver X-Ray Conference, the topic for the plenary lectures alternates annually between x-ray diffraction and x-ray fluorescence. This year is a "diffraction" year, and the theme is accuracy in powder diffraction. Instead of comprehensive cover­ age, such as was attempted at the Accuracy in Powder Diffraction Meeting held at the National Bureau of Standards in 1978, this meeting focuses on recent developments in measurement accuracy of two-theta and intensity. The focus on accuracy, from the practical point of view, is important in a wide range of x-ray diffraction measurements. Accu­ rate data improve our ability to identify phases in a mixture using the Powder Diffraction File. Improved accuracy is essential for better characterization of the lattice, crystallite size, strain and structure. Finally, the accuracy of quantitative analysis is of great concern in many laboratories. The five invited papers of the plenary session give a broad perspective of recent activity throughout the world on uses of more accurate data, on methods to achieve greater accuracy, and on fundamental factors affecting the accuracy. The scope of the conference, however, is much broader than that of the plenary session. The workshops lead off with many practical aspects of x-ray analysis. Many of the contributed papers expand on the theme of accuracy in x-ray powder diffraction. In particular, the s.ession on XRD quantitative phase analysis provides an exception­ al coverage of the limitations in quantitative analysis and of the techniques being employed to improve the results.

目次

I. Accuracy in X-ray Powder Diffraction.- Accuracy in Angle and Intensity Measurements in X-Ray Powder Diffraction.- Precision Lattice Parameter Measurements with Guinier Camera and Counter Diffractometer: Comparison and Reconciliation of Results.- Effects of Diffractometer Alignment and Aberrations on Peak Positions and Intensities.- Accuracy and Precision of Intensities in X-Ray Polycrystalline Diffraction.- New Standard Reference Materials for X-Ray Powder Diffraction.- Precision and Reproducibility of Lattice Parameters from Guinier Powder Patterns: Follow-up and Assessment.- II. Search/Match Procedures, Powder Diffraction File.- POWDER-PATTERN: A System of Programs for Processing and Interpreting Powder Diffraction Data.- An Evaluation of Some Profile Models and the Optimization Procedures Used in Profile Fitting.- Computer-Aided Qualitative X-Ray Powder Diffraction Phase Analysis.- The JCPDS Data Base — Present and Future.- Search/Match Implications of the Frequency Distribution of “d” Values in the JCPDS Powder Data File.- Computer Search/Match of Standards Containing a Small Number of Reflections.- Comparison of the Hanawalt and Johnson-Vand Computer Search/Match Strategies.- III. Quantitative XRD Analysis.- A Comparison of Methods for Reducing Preferred Orientation.- The Dramatic Effect of Crystallite Size on X-Ray Intensities.- X-Ray Diffraction Intensity of Oxide Solid Solutions: Application to Qualitative and Quantitative Phase Analysis.- Quantitative Analys is of Platelike Pigments by X-Ray Diffraction.- Preparation and Certification of Standard Reference Materials to be Used in the Determination of Retained Austenite in Steels.- Profile Fitting for Quantitative Analysis in X-Ray Powder Diffraction.- XRD Quantitative Phase Analysis Using theNBS*QUANT82 System.- SCRIP - Fortran IV Software for Quantitative XRD.- IV. XRD Applications and Automation.- An X-Ray Diffraction Study of CaNi5 Hydrides Using In Situ Hydriding and Profile Fitting Methods.- The Measurement of Thermally Induced Structural Changes by High Temperature (900°C) Guinier X-Ray Powder Diffraction Techniques.- The Use of X-Ray Diffraction and Infrared Spectroscopy to Characterize Hazardous Wastes.- Comparison of X-Ray Powder Diffraction Techniques.- The Use of Multi-Scan Diffraction in Phase Identification.- An Automated X-Ray Diffractometer for Detection and Identification of Minor Phases.- Time Share Computer Capability for Phase Identification by X-Ray Diffraction.- V. X-Ray Stress Determination, Position Sensitive Detectors, Fatigue and Fracture Characterization.- The Use of Mn-K? X-Rays and a New Model of PSPC in Stress Analysis of Stainless Steel.- Measurement of Stress Gradients by X-Ray Diffraction.- A Method for X-Ray Stress Analysis of Thermochemically Treated Materials.- Application of a Position Sensitive Scintillation Detector for Nondestructive Residual Stress Measurements Inside Stainless Steel Piping.- On the X-Ray Diffraction Method of Measurement of Triaxial Stresses with Particular Reference to the Angle 2?o.- Direct Determination of Stress in a Thin Film Deposited on a Single-Crystal Substrate from an X-Ray Topographic Image.- The Determination of Elastic Constants Using a Combination of X-Ray Stress Techniques.- One-Dimensional, Curved, Position-Sensitive Detector for X-Ray Diffractometry.- A Phi-Psi-Diffractometer for Residual Stress Measurements.- X-Ray Fractography on Fatigue Fractured Surface.- X-Ray Diffraction Observation of Fracture Surfaces of Ductile Cast Iron.- Analytical and Experimental Investigation ofFlow and Fracture Mechanisms Induced by Indentation in Single Crystal MgO.- X-Ray Diffraction Study of Shape Memory in Uranium-Niobium Alloys.- VI. New XRF Instrumentation and Techniques.- X-Ray Fluorescence Analysis Using Synchrotron Radiation..- Energy Resolution Measurements of Mercuric Iodide Detectors Using a Cooled FET Preamplifier.- X-Ray Polarization: Bragg Diffraction and X-Ray Fluorescence.- A New Technique for Radioisotope-Excited X-Ray Fluorescence.- Bragg-Borrmann X-Ray Spectroscopy from a Line Source 341.- VII. XRF Computer Systems and Mathematical Corrections.- Automated Qualitative X-Ray Fluorescence Elemental Analysis.- A New Method for Quantitative X-Ray Fluorescence Analysis of Mixtures of Oxides or Other Compounds by Empirical Parameter Methods.- FPT: An Integrated Fundamental Parameters Program for Broadband EDXRF Analysis Without a Set of Similar Standards.- A Comparison of the XRF11 and EXACT Fundamental Parameters Programs When Using Filtered Direct and Secondary Target Excitation in EDXRF.- A Generalized Matrix Correction Approach for Energy- Dispersive X-Ray Fluorescence Analysis of Paint Using Fundamental Parameters and Scattered Silver K? Peaks.- Multielement Analysis of Unweighed Biological and Geological Samples Using Backscatter and Fundamental Parameters.- A Correction Method for Absorption in the Analysis of Aerosols by EDX Spectrometry.- XRF Analysis by Combining the Standard Addition Method with Matrix-Correction Models.- Accurate Geochemical Analysis of Samples of Unknown Composition.- VIII. XRF General Applications.- XRF Analysis of Vegetation Samples and Its Application to Mineral Exploration.- Application of XRF to Measure Strontium in Human Bone In Vivo.- Determination of Boron Oxide in Glass by X-Ray Fluorescence Analysis.-Measurement of Composition and Thickness for Single Layer Coating with Energy Dispersive XRF Analysis.- Determination of Light Elements on the Chem-X Multichannel Spectrometer.- Simultaneous Determination of 36 Elements by X-Ray Fluorescence Spectrometry as a Prospecting Tool.- Elemental Analysis of Geological Samples Using a Multichannel, Simultaneous X-Ray Spectrometer.- Chemical Analysis of Coal by Energy Dispersive X-Ray Fluorescence Utilizing Artificial Standards.- Author Index.

巻冊次

v. 27 ISBN 9780306417122

内容説明

This volume constitutes the proceedings of the 1983 Denver Conference on Applications of X-ray Analysis and is the 27th in the series. The conference was held jointly with the American Crystal­ lographic Association at Snowmass Resort, Colorado, from August 1 to 5, 1983. The papers appearing in this volume are only from pre­ dominantly Denver Conference (DC) sessions and from joint DC/ACA sessions. The early plans for holding a joint conference were initiated some three years ago by Q. C. Johnson of Lawrence Livermore Lab, J. B. Cohen of Northwestern University and P. K. Predecki of the University of Denver and were eventually brought to fruition by a jOint organizing committee consisting of: O. P. Anderson, Colorado State University (ACA) , D. E. Leyden, Colorado State University (DC), R. D. Witters, Colorado School of Mines (ACA) and P. K. Predecki (DC). We take this opportunity to thank the committee members and the early planners for their vision, ingenuity and hard work without which the conference would not have materialized. There was no plenary session in 1983, instead a number of special sessions were organized and chaired by various individuals.

目次

I. J. D. Hanawalt Award Session On Search/Match Methods.- II. X-Ray Strain and Stress Determination.- III. Position Sensitive Detectors and X-Ray Instrumentation.- IV. Quantitative Phase Analysis by XRD.- V. Other XRD Applications.- VI. J. Gilfrich Honorary Session on Trends in XRF Instrumentation.- VII. Mathematical Models and Computer Applications in XRF.- VIII. Applications of XRF to Archeological, Geochemical and Industrial Materials.- IX. Other XRF Applications.- Author Index.

巻冊次

v. 28 ISBN 9780306419393

内容説明

The 33rd Annual Denver Conference on Applications of X-Ray Analysis was held July 30-August 3. 1984. on the campus of the University of Denver. Following the recent tradition of alternating plenary lecture topics between X-ray diffraction and X-ray fluorescence at the confer­ ence. the plenary sessions dealt with topics of X-ray fluorescence. Prof. H. Aiginger presented a plenary lect~re on TOTAL REFLECTANCE X-RAY SPECTROMETRY which admirably described this relatively new technique. J. C. Russ discussed XRF AND OTHER SURFACE ANALYTICAL TECHNIQUES which gave an excellent overview of the role XRF plays in a modern analytical laboratory. J. E. Taggart. Jr. described THE ROLE OF XRF IN A MODERN GEOCHEMICAL LABORATORY and presented many case histories of the configura­ tion of analytical equipment in several geochemical laboratories. The plenary lectures demonstrated both the dynamic nature of research in X-ray fluorescence. and the important role X-ray spectrom­ etry plays in the arsenal of analytical methods found in modern labora­ tories. Total reflectance X-ray spectrometry takes advantage of con­ sideration of the geometry of the X-ray optics. Potentially. new sample types may be considered as X-ray fluorescence specimens using this technique.

目次

I. The Role of X-Ray Fluorescence in a Modern Analytical Laboratory (Plenary Session Papers).- Total Reflectance X-Ray Spectrometry.- XRF and Other Surface Analysis Techniques.- The Role of X-Ray Fluorescence in a Modern Geochemical Laboratory.- II. Mathematical Models And Computer Applications In XRF.- Use of Primary Beam Filtration in Estimating Mass Attenuation Coefficients by Compton Scattering.- An Evaluation of Correction Algorithms, Using Theoretically Calculated Intensities.- Monte Carlo Simulations of XRF Intensities in Samples Containing a Dispersed Phase.- Two Easily-Overlooked Sources of Error in XRF Intensity Measurements.- Coordination Analysis by High Resolution X-Ray Spectroscopy.- III. New Techniques and Instrumentation in XRF.- The Application of Tunable Monochromatic Synchrotron Radiation to the Quantitative Determination of Trace Elements.- Energy Dispersive X-Ray Fluorescence Analysis Using Synchroton Radiation.- The Application of Linear Polarized X-Rays after Bragg Reflection for X-Ray Fluorescence Analysis..- Trace Analytical Capabilities of Total-Reflection X-Ray Fluorescence Analysis.- Qualitative Analysis of X-Ray Spectra.- K-Edge X-Ray Fluorescence Analysis for Actinide and Heavy Elements Solution Concentration Measurements.- Excitation and Detection of High Energy Chracteristic X-Rays (20–90 KeV) Using a Novel Radiometric Technique.- An Examination of the Overall Stability of an XRF Spectrometer with Special Reference to Fourier Analysis of Temporal Variation.- Evaluation of the New Generation of Dual-Anode X-Ray Tubes.- Comparison of Various X-Ray Tube Types for XRF Analysis.- IV. Recent Developments in Long-Wavelength Spectroscopy.- Reflection Intensity Dependence on Surface and Wavelength from LiF and EDDT Analyzer Crystals.- A SoftX-Ray Experimental Facility.- Wavelength Dispersing Devices for Soft and Ultrasoft X-Ray Spectrometers.- V. Applications of XRF and XRD to Life Sciences and the Environment.- Feasibility Studies of X-Ray Fluorescence as a Method for the In Vivo Determination of Platinum and Other Heavy Metals.- A Fast, Versatile X-Ray Fluorescence Method for Measuring Tin in Impregnated Wood.- Certification of Reference Materials by Energy-Dispersive X-Ray Fluorescence Spectrometry?.- Evaluating the Variability of Southwestern Ceramics with X-Ray Fluorescence.- An XRF Method for the Analysis of Atmospheric Aerosol and Vehicular Particulate Deposits on Filters.- VI. XRF Applications: Mineralogical, General.- Analysis of River Sediments from the Tigre River (Venezuela) by Radioisotope Excited X-Ray Fluorescence.- Energy-Dispersive XRF Analysis of Intact Salt Drill Cores.- The Use of Rapid Quantitative X-Ray Fluorescence Analysis in Paper Manufacturing and Construction Materials Industry.- Analysis of Diatomaceous Earth by X-Ray Fluorescence Techniques.- Fundamental Parameters vs. Multiple Regression Calculations for the Determination of Europium in Oxide Catalyst Supports by XRF.- EDXRF Determination of Major and Minor Elements in Compound Fertilizers.- Analysis of Wet-Process Phosphoric Acid and By-Product Filter Cake by X-Ray Spectrometry.- VII. New Techniques and Instrumentation in XRD.- The Rapid Simultaneous Measurement of Thermal and Structural Data by a Novel DSC/XRD Instrument.- Balanced Filters for an Annular Counter.- X-Ray Diffraction Measurements via a UNIX+ Based System.- TSX-PLUS Multi-Tasking Upgrade for the Nicolet L-11 Powder Diffraction System.- VIII. X-Ray Strain and Stress Determination.- X-Ray Multiaxial Stress Analysis on Materials with Stress Gradient by Use of Cos? Function.- A Practical ?-Method for the Evaluation of Stress on Materials with Stress Gradient by X-Rays.- Residual Stress Measurements in Inconel Alloy 600 Tubing Using an Advanced X-Ray Instrument and Cr K? Radiation.- Determination of the Unstressed Lattice Parameter “ao” for (Triaxial) Residual Stress Determination by X-Rays.- X-Ray Fractographic Approach to Fracture Toughness of AISI 4340 Steel.- Strain Measurements on Single Crystals and Macrograins with the Aid of an Automated Phi-Psi Goniometer.- IX. XRD Search/Match Methods and Quantitative Analysis.- The Quality of X-Ray Diffraction Standards for Phosphate Minerals and the Degree of Success in Computer Identification.- Results of a Round Robin Study of Systematic Errors Found in Routine X-Ray Diffraction Raw Data.- An X-Ray Diffraction Procedure for Measuring Retained Austenite in High Chromium White Cast Iron.- Quantitative X-Ray Analysis of ICPP Simulated High Alumina Calcine.- X. XRD Applications.- High Temperature XRD Studies of Selected Carbonate Minerals.- High Temperature X-Ray Diffraction Studies of the Defluorination Reactions of Chukhrovite, Falphite and Ralstonite.- Low Thermal Expansion of Alkali Zirconium Phosphates Using a Microcomputer Automated Diffractometer.- The Structure and Lattice Parameters of Pentaerythritol Above and Below Its Phase-Transition Temperature.- A Comparison of Detection Systems for Trace Phase Analysis.- X-Ray Diffraction/Electron Microprobe Analysis of Surface Films Formed on Alloys During Hydrothermal Reaction with Geologic Materials.- Determination of the Crystal System of a Neodymium-Iron-Boron Alloy by X-Ray Diffraction.- An X-Ray Diffraction Method for the Determination of Temperatures in Coke Reactions.- Author Index.

巻冊次

v. 29 ISBN 9780306422874

内容説明

The 37th Annual Denver Conference on Applications of X-Ray Analysis was held August 1-5, 1988, at the Sheraton Steamboat Resort and Conference Center, Steamboat Springs, Colorado. As usual, alternating with x-ray diffraction, the emphasis this year was x-ray fluorescence, but as has been the pattern for several occasions over the last few years, the Plenary Session did not deal with that subject, specifically. In an attempt to introduce the audience to one of the new developments in x-ray analysis, the title of the session was "High Brilliance Sources/Applications," and dealt exclusively with synchrotron radiation, a topic which has made a very large impact on the x-ray community over the last decade. As the organizer and co-chairman of the Plenary Session (with Paul Predecki), it is my responsibility to report on that session here. The Conference had the privilege of obtaining the services of some of the preeminent practitioners of research using this remarkable x-ray source; they presented the audience with unusually lucid descriptions of the work which has been accomplished in the development and application of the continuous, high intensity, tunable, polarized and collimated x-rays available from no facility other than these specialized storage rings. The opening lecture (and I use that term intentionally) was an enthusiastic description of "What is Synchrotron Radiation?" by Professor Boris Batterman of Cornell University and the Cornell High Energy Synchrotron Sourc(! (CHESS).

巻冊次

v. 30 ISBN 9780306426902

内容説明

The 35th Annual Denver Conference on Applications of X-Ray Analysis was held August 4-8, 1986, on the campus of the University of Denver. Since the previous year's conference had emphasized x-ray diffraction, this year the Plenary Session spotlighted x-ray fluorescence, with the title "Trends in XRF: A World Perspective," featuring renowned speakers from three major areas. XRF IN NORTH AMERICA, by Prof. D. E. Leydon, from Colorado State University, dealt specifically with developments in the fields of instrumentation, data treatment and applications in that part of the world. Prof. H. Ebel, from the Technical University of Vienna, discussed XRF IN EUROPE, concentrating on subjects including total reflection, improved fundamental parameters, quantitation without standards and imaging techniques. Tomoya Arai, of the Rigaku Industrial Corporation in Japan, in considering XRF IN THE FAR EAST, described the scientific activity in XRF and the applications thereof, primarily in Japan and China. These plenary lectures were interspersed with short discussions of PERSONAL OBSERVATIONS on the subject by the co-chairmen of the SeSSion, Ron Jenkins and myself. The intent of this session was to bring the audience up-to-date on the status of the field in various parts of the world, and to give some feeling concerning where it is likely to go in the immediate future. Hopefully, the publication of the written versions of those presentations in this volume will make the authors' thoughts available to many who could not be present at the conference.

目次

• I. Trends in XRF: A World Perspective (Plenary Session).- II. XRF Techniques and Instrumentation.- III. XRF Fundamental Parameters and Data Analysis.- IV. Recent Developments in XRF Dispersion Devices.- V. XRF Applications
• Fuels and Lubricants, Metals and Alloys, Geological, Heavy Element, other.- VI. Quantitative Phase Analysis by XRD.- VII. Synchrotron and Neutron Diffraction.- VIII. Advances in XRD Instrumentation and Procedures.- IX, HIgh Temperature and Non-Ambient Powder Diffraction Applications.- X. X-Ray Stress Analysis, Fractography.- XI, Analytical X-ray Safety (Workshop Presentations).- Author Index.

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詳細情報

• NII書誌ID(NCID): BA0046111X
• ISBN:
  • 0306381176
  • 0306381184
  • 0840313837
  • 0306381206
  • 0306384213
  • 0306401630
  • 0306404354
  • 0306407345
  • 0306410087
  • 0306413701
  • 030641712X
  • 0306419394
  • 0306422875
  • 0306426900
• LCCN: 58035928
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: New York
• ページ数/冊数: v.
• 大きさ: 26 cm