Proceedings of the 13th International Conference on Defects in Semiconductors

Author(s)

• International Conference on Defects in Semiconductors
• Kimerling, L. C.
• Parsey, J. M. (John Michael) Jr.
• Metallurgical Society of AIME. Electronic Materials Committee

Bibliographic Information

Proceedings of the 13th International Conference on Defects in Semiconductors

Thirteenth International Conference on Defects in Semiconductors; sponsored by the Electronic Materials Committee of the Metallurgical Society of AIME, held at Coronado, California, August 12-17, 1984 ; edited by L.C. Kimerling and J.M. Parsey, Jr.

Metallurgical Society of AIME, c1985

Note

Includes bibliographies and indexes

Details

• NCID: BA00608648
• ISBN:
  • 0895204851
• LCCN: 84062228
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Warrendale, Pa.
• Pages/Volumes: xxiii, 1252 p.
• Size: 24 cm
• Classification:
  • LCC : QC611.6.D4
  • DC19 : 621.3815/2
• Subject Headings:
  • LCSH : Semiconductors -- Defects -- Congresses