New horizons in testing : latent trait test theory and computerized adaptive testing

Author(s)

• Weiss, David J.
• Bock, R. Darrell
• Computerized Adaptive Testing Conference
• United States. Office of Naval Research

Bibliographic Information

New horizons in testing : latent trait test theory and computerized adaptive testing

edited by David J. Weiss ; contributors, R. Darrell Bock ... [et al.]

Academic Press, 1983

Note

Derived from the 1979 Computerized Adaptive Testing Conference held at Wayzata, Minn., sponsored by the U.S. Office of Naval Research, et al

Includes bibliographies and indexes

• NCID: BA00680204
• ISBN:
  • 0127427805
• LCCN: 82024374
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: New York
• Pages/Volumes: xvii, 345 p.
• Size: 24 cm
• Classification:
  • LCC : BF176
  • DC19 : 153.9/3
• Subject Headings:
  • LCSH : Psychological tests -- Congresses