Psychometrics for educational debates

著者

• International Symposium on Educational Testing
• Kamp, Leo J. Th. van der
• Langerak, Willem F.
• Gruijter, Dato N. de

書誌事項

Psychometrics for educational debates

edited by Leo J. Th. van der Kamp, Willem F. Langerak, and Dato N. M. de Gruijter

Wiley, c1980

注記

"Proceedings of the Third International Symposium on Educational Testing, held in Leyden, The Netherlands, June 27-30, 1977."

Includes bibliographies and indexes

詳細情報

• NII書誌ID(NCID): BA00735871
• ISBN:
  • 0471275964
• LCCN: 79004308
• 出版国コード: uk
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Chichester ; New York
• ページ数/冊数: x, 337 p.
• 大きさ: 24 cm
• 分類:
  • LCC : LB3051
  • DC : 371.2/6
• 件名:
  • LCSH : Educational tests and measurements -- Congresses