Psychometrics for educational debates

Author(s)

• International Symposium on Educational Testing
• Kamp, Leo J. Th. van der
• Langerak, Willem F.
• Gruijter, Dato N. de

Bibliographic Information

Psychometrics for educational debates

edited by Leo J. Th. van der Kamp, Willem F. Langerak, and Dato N. M. de Gruijter

Wiley, c1980

Note

"Proceedings of the Third International Symposium on Educational Testing, held in Leyden, The Netherlands, June 27-30, 1977."

Includes bibliographies and indexes

Details

• NCID: BA00735871
• ISBN:
  • 0471275964
• LCCN: 79004308
• Country Code: uk
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Chichester ; New York
• Pages/Volumes: x, 337 p.
• Size: 24 cm
• Classification:
  • LCC : LB3051
  • DC : 371.2/6
• Subject Headings:
  • LCSH : Educational tests and measurements -- Congresses