Secondary ion mass spectrometry : SIMS V : proceedings of the fifth international conference, Washington, DC, September 30-October 4, 1985

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Secondary ion mass spectrometry : SIMS V : proceedings of the fifth international conference, Washington, DC, September 30-October 4, 1985

editors, A. Benninghoven ... [et al.]

(Springer series in chemical physics, 44)

Springer-Verlag, c1986

  • : gw

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Includes bibliographies and index

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