Applied surface analysis : a symposium

著者

• Barr, T. L. (Tery Lynn)
• Davis, L. E.
• ASTM Committee E-42 on Surface Analysis
• Pittsburgh Conference on Analytical Chemistry and Applied Spectroscopy

書誌事項

Applied surface analysis : a symposium

sponsored by ASTM Committee E-42 on Surface Analysis, American Society for Testing and Materials, Cleveland, Ohio, 28 Feb.-1 March, 1978 ; T. L. Barr, L. E. Davis, editors

（ASTM special technical publication, 699）

ASTM, c1980

注記

Held in conjunction with the 29th Pittsburgh Conference on Analytical Chemistry and Applied Spectroscopy and jointly sponsored by the Conference and ASTM Committee E-42 on Surface Analysis

Includes bibliographical references and index

詳細情報

• NII書誌ID(NCID): BA01111849
• LCCN: 79054723
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Philadelphia, Pa.
• ページ数/冊数: 207 p.
• 大きさ: 24 cm
• 分類:
  • LCC : TA418.7
  • DC19 : 620.1/1292
• 件名:
  • LCSH : Surfaces (Technology) -- Analysis -- Congresses
• 親書誌ID:
  • BA00068096