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INSPEC, Institution of Electrical Engineers
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EMIS data reviews series
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1
- Properties of amorphous carbon
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edited by S. R. P. Silva
The Institution of Engineering and Technology 2008 EMIS datareviews series no. 29
: paperback
Available at 1 libraries
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2
- Properties of silicon germanium and SiGe : carbon
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edited by Erich Kasper and Klara Lyutovich
Institution of Electrical Engineers c2006 EMIS datareviews series no. 24
: [pbk.]
Available at 1 libraries
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3
- Properties of crystalline silicon
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edited by Robert Hull
Institution of Electrical Engineers c2006 EMIS datareviews series no. 20
: [pbk.]
Available at 3 libraries
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4
- Properties of silicon carbide
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edited by Gary L. Harris
IEE c2006 EMIS datareviews series 13z
Available at 2 libraries
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5
- Properties of amorphous carbon
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edited by S. Ravi P. Silva
INSPEC, Institution of Electrical Engineers c2003 EMIS datareviews series no. 29
Available at 4 libraries
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6
- Properties of lithium niobate
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edited by K.K. Wong
INSPEC/Institution of Electrical Engineers c2002 EMIS datareviews series no. 28
Available at 3 libraries
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7
- Properties, growth and applications of diamond
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edited by M. H. Nazaré and A. J. Portugal
INSPEC, Institution of Electrical Engineers c2001 EMIS datareviews series no. 26
Available at 7 libraries
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8
- Physical properties of liquid crystals: nematics
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edited by David Dunmur, Atsuo Fukuda and Geoffrey Luckhurst
INSPEC, Institution of Electrical Engineers c2001 EMIS datareviews series no. 25
Available at 2 libraries
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9
- Properties of silicon germanium and SiGe : carbon
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edited by Erich Kasper and Klara Lyutovich
INSPEC, Institution of Electrical Engineers c1999 EMIS datareviews series no. 24
Available at 7 libraries
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10
- Properties, processing and applications of indium phosphide
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edited by T. P. Pearsall
Institution of Electrical Engineers 1999 EMIS datareviews series no.21
Available at 2 libraries
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11
- Properties, processing and applications of gallium nitride and related semiconductors
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edited by James H. Edgar ... [et al.]
INSPEC c1999 EMIS datareviews series no.23
Available at 12 libraries
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12
- Properties of crystalline silicon
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edited by Robert Hull
INSPEC, Institution of Electrical Engineers c1999 EMIS datareviews series no. 20
Available at 15 libraries
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13
- Properties, processing and applications of glass and rare earth-doped glasses for optical fibres
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edited by Dan Hewak
INSPEC c1998 EMIS datareviews series no.22
Available at 8 libraries
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14
- Properties of amorphous silicon and its alloys
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edited by Tim Searle
INSPEC, Institution of Electrical Engineers c1998 EMIS datareviews series no. 19
Available at 9 libraries
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15
- Properties of porous silicon
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edited by Leigh Canham
INSPEC, Institution of Electrical Engineers c1997 EMIS datareviews series no. 18
Available at 16 libraries
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16
- Properties of wide bandgap II-VI semiconductors
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edited by Rameshwar Bhargava
INSPEC, Institution of Electrical Engineers c1997 EMIS datareviews series no. 17
Available at 18 libraries
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17
- Properties of gallium arsenide
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INSPEC, Institution of Electrical Engineers c1996 3rd ed. / edited by M.R. Brozel and G.E. Stillman EMIS datareviews series no. 16
Available at 8 libraries
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18
- Properties of III-V quantum wells and superlattices
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edited by Pallab Bhattacharya
INSPEC c1996 EMIS datareviews series No. 15
Available at 11 libraries
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19
- Properties of silicon carbide
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edited by Gary L. Harris
INSPEC c1995 EMIS datareviews series no. 13
Available at 13 libraries
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20
- Properties of strained and relaxed silicon germanium
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edited by Erich Kasper
INSPEC, IEE c1995 EMIS datareviews series no. 12
Available at 8 libraries
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