Atomic collisions in solids : [proceedings of the fifth International Conference on Atomic Collisions in Solids held in Gatlinburg, Tennessee, September 24-28, 1973]

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Atomic collisions in solids : [proceedings of the fifth International Conference on Atomic Collisions in Solids held in Gatlinburg, Tennessee, September 24-28, 1973]

[sponsored by Oak Ridge National Laboratory] ; edited by Sheldon Datz, B. R. Appleton, and C. D. Moak

Plenum Press, c1975

  • v. 1
  • v. 2

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Includes bibliographical references and index

Description and Table of Contents

Volume

v. 1 ISBN 9780306382116

Table of Contents

Stopping Power of Fast Channeled Protons in the Impact Parameter Treatment of Atomic Collisions.- The Z1 Oscillations in Electronic Stopping.- Z13-Dependent Stopping Power and Range Contributions.- Depth Distribution of Damage Due to Ionization.- Investigation on Electronic Stopping Power in Alkali Halides by Means of Color Center Profiles.- Velocity Dependence of the Stopping Power of Channeled Iodine Ions.- Charge State Dependence of Stopping Power for Oxygen Ions Channeled in Silver.- Transmission Energy Loss of Protons Channeled in Thin Silicon Single Crystals at Medium Energy.- A New Method to Determine the Energy Loss of Heavy Ions in Solids.- Threshold Energy for Atomic Displacement in Radiation Damage.- Directional Dependence of the Displacement Energy Threshold for a FCC Metal.- Energy Dissipation by Random Collisions in Compound Target Materials.- On the Application of Boltzmann Transport Equations to Ion Bombardment of Solids.- Indication for an Ionization Damage Process in Light Ion Irradiation Damage in Silicon.- Recoil Implantation of 18O from SiO2 by Heavy Projectiles.- Effects of Lattice Defects on Dechanneling and on Channeled-Particle Distribution.- Computer Simulation of Atomic Collisions in Solids.- The Effect of Straggling in Electronic Stopping on Range Distributions.- Computer Simulation of the Multiple Scattering of High Energy Heavy Ions in Thin Films.- Numerical Simulation of Range and Backscattering for keV Protons Incident on Random Targets.- Computer Studies of Replacement Sequences in Solids Associated with Atomic Displacement Cascades.- Radiation Damage in Transition Metal Hexahalo Complexes: The Application of Atomic Collision Dynamics in Hot Atom Chemistry.- Monte Carlo Simulation of Backscattering Phenomena.- Ion Screening in Solids.- Surf-Riding Electron States: Polarization Charge Density Effects Associated with Heavy Ion Motion in Solids.- Electron Spin Polarization at Ferromagnetic Single Crystalline Nickel Surfaces Determined through Electron Capture by Scattered Deuterons.- Electron Pick Up by Protons Emerging from Solid Surfaces.- Experimental Neutral Charge Fractions in Proton Beams Emerging from Solids.- Charged Fraction of 5 keV to 150 keV Hydrogen Atoms after Emergence from Different Metal Surfaces.- Charge Neutralization of Medium Energy H and 4He Ions Backscattered from Solid Surfaces. Effects of Surface Cleaning.- Solid Effects on Inner Shell Ionization.- Quasi-Molecular Approach to the Theory of Ion-Atom Collisions.- An Investigation of the Processes Involved in the Production of Non-Characteristic X Rays During Ion Bombardment of Solid Targets.- Observation of the United Carbon-Carbon Atom K-Shell X-Ray Band for Incident Carbon Ion Energies of 30-2500 keV.- Cross Sections for the Production of X Rays from Heavy Ion Collisions at MeV Energies.- De-Excitation of Sulphur L-Shell Vacancies Produced in Ion-Atom Collisions in Solids.- Ion Excitation of Al K X-Ray Spectra.- X-Ray Emission Following Ion Beam and Plasma Excitations.- Application of a Cauchois Spectrometer to Measurement of Ion-Excited Ni K? Satellite Spectra.- Charge State Dependence of Si K X-Ray Production in Solid and Gaseous Targets by 40 MeV Oxygen Ion Impact.- Excitation States of Projectiles Moving through Solids.
Volume

v. 2 ISBN 9780306382123

Table of Contents

of Volume 2.- Section VI: Electrons, Photons, and Channeling.- Radiative Electron Capture and Bremsstrahlung.- Radiative Electron Capture by Channeled Oxygen Ions.- The Influence of Channeling on the Shape and Intensity of Doppler-Broadened Spectral Lines Produced by Light Ion Bombardment of Metals.- Optical Line and Broad-Band Emission from Ion-Bombarded Targets.- Reduction of the Characteristic Radiation Due to the Channeling Effect.- Electron Channeling in Si, Ag and Au Crystals.- Emission of Electrons and Positrons from Crystals - Directional Effects.- Channeling of 25 MeV Positrons and Electrons.- The Channeling-Blocking Effect of Energetic Electrons.- Coherent Photon Emission by Fast Particle Excited Atoms in Electromagnetic Field.- Effect of the Levels of the Transverse Motion of Electrons on the Electromagnetic Processes in Monocrystals.- Section VII: Surface Scattering.- Medium-Energy Ion Scattering by Crystal Surfaces.- Some Directional Effects in Forward Ion Scattering by Crystal Surfaces.- On the Scattering of Low Energy H+ and He+ Ions from a (001) Copper Surface.- Influence of Thermal Lattice Vibrations on Multiple Ion Scattering.- X-Ray Production and Energy Loss in Low-Angle Ion Scattering at Solid Surfaces.- Surface Scattering of Low Energy Ions.- Hybrid Computational Studies of Elastic Scattering of Atoms.- Sputtering of Condensed Gases by Proton Bombardment.- The Angular Distribution of Fast Charged Particles Reflected by the Surface of a Single Crystal.- Section VIII: Channeling.- Hyperchanneling.- Channeling Studies of Alkali Halides.- Molecular Ion Transmission Through a Monocrystalline Thin Film.- A Combination of Dechanneling and Energy Measurements of Protons in Thin Silicon Single Crystals.- Flux Peaking, Dechanneling Cross Section, and Detection Probability in Channeling and Blocking Experiments from Computer Simulations and Analytical Models.- Analysis of Blocking Lifetime Experiments.- Channeling, Blocking, and Range Measurements Using Thermal Neutron Induced Reactions.- Experimental Investigation of the Reversibility Rule at Non Zero Depth.- Effect of Reaction Time on the Minimum Yields of Axial and Planar Blockings.- High Index Planar Channeling in Silicon.- Section IX: Channeling.- Double Planar Alignment Scattering with a Very Thin Crystal.- Axial and Planar Channeling in TiOx System.- Energy Dependence of the Surface Minimum Yield for Axial Channeling.- Experimental Study and Stochastic Interpretation of Oscillatory Effects in Backscattering Spectra in Planar Channeling.- Interstital Atom Location in Silicon by Single and Double Alignment Backscattering of MeV Helium Ions.- Section X: Dechanneling.- Validity of the Statistical Equilibrium Hypothesis for Channeling.- Axial Dechanneling, I. A Theoretical Study.- Axial Dechanneling, II. An Experimental Study.- Dechanneling and Rechanneling Calculations.- Modified Dechanneling Theory and Diffusion Coefficients.- Inelastic Scattering in Channeling.- Channeling in a Non Perfect Crystal.- Transmission Energy Spectra of Channeled Protons Scattered in Thin Silicon Films.- Interference Decrease of Elastic Scattering of Fast Charged Particles in Single Crystals.

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