Novel application of anomalous (resonance) X-ray scattering for structural characterization of disordered materials
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Novel application of anomalous (resonance) X-ray scattering for structural characterization of disordered materials
（Lecture notes in physics, 204）
Springer-Verlag, 1984
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- : us
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Anomalous (resonance) X-ray scattering for structural characterization of disordered materials
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The Institute for Solid State Physics Library. The University of Tokyo.図書室
: gw428.46:N67230040847
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Hokkaido University, Library, Graduate School of Science, Faculty of Science and School of Science研究室
: gw530/L4972021251648
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Note
Bibliography: p. [170]-177
Includes index
