Characterization of defects in materials : symposium held December 1-2, 1986, Boston, Massachusetts, U.S.A.

Author(s)

• Siegel, Richard W.
• Sinclair, Robert
• Weertman, Julia R. (Julia Randall)
• Materials Research Society
• Materials Research Society. Meeting
• Symposium on the Characterization of Defects in Materials

Bibliographic Information

Characterization of defects in materials : symposium held December 1-2, 1986, Boston, Massachusetts, U.S.A.

editors, Richard W. Siegel, Julia R. Weertman, Robert Sinclair

（Materials Research Society symposium proceedings, v. 82）

Materials Research Society, c1987

Note

Includes bibliographies

Details

• NCID: BA01314391
• ISBN:
  • 0931837472
• LCCN: 87014023
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Pittsburgh, Pa.
• Pages/Volumes: xv, 532 p.
• Size: 24 cm
• Classification:
  • LCC : TA418.5
  • DC19 : 620.1/12
• Subject Headings:
  • LCSH : Materials -- Defects -- Congresses
  • LCSH : Crystals -- Defects -- Congresses
• Parent Bibliography ID:
  • BA00013775