Characterization of defects in materials : symposium held December 1-2, 1986, Boston, Massachusetts, U.S.A.

著者

• Siegel, Richard W.
• Sinclair, Robert
• Weertman, Julia R. (Julia Randall)
• Materials Research Society
• Materials Research Society. Meeting
• Symposium on the Characterization of Defects in Materials

書誌事項

Characterization of defects in materials : symposium held December 1-2, 1986, Boston, Massachusetts, U.S.A.

editors, Richard W. Siegel, Julia R. Weertman, Robert Sinclair

（Materials Research Society symposium proceedings, v. 82）

Materials Research Society, c1987

注記

Includes bibliographies

詳細情報

• NII書誌ID(NCID): BA01314391
• ISBN:
  • 0931837472
• LCCN: 87014023
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Pittsburgh, Pa.
• ページ数/冊数: xv, 532 p.
• 大きさ: 24 cm
• 分類:
  • LCC : TA418.5
  • DC19 : 620.1/12
• 件名:
  • LCSH : Materials -- Defects -- Congresses
  • LCSH : Crystals -- Defects -- Congresses
• 親書誌ID:
  • BA00013775