Sinclair, Robert

ID:DA01896034

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1

High resolution electron microscopy of defects in materials : symposium held April 16-18, 1990, San Francisco, California, USA

editors, Robert Sinclair, David J. Smith, Ulrich Dahmen

Materials Research Society c1990 Materials Research Society symposium proceedings v. 183

Available at 10 libraries
2

Characterization of defects in materials : symposium held December 1-2, 1986, Boston, Massachusetts, U.S.A.

editors, Richard W. Siegel, Julia R. Weertman, Robert Sinclair

Materials Research Society c1987 Materials Research Society symposium proceedings v. 82

Available at 16 libraries

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