Advances in optical and electron microscopy

著者

• Barer, R.
• Cosslett, V. E. (Vernon Ellis)
• Mulvey, T.
• Sheppard, C. J. R.

書誌事項

Advances in optical and electron microscopy

edited by R. Barer and V.E. Cosslett

Academic Press, 1966-

• v. 1
• v. 2
• v. 3
• v. 4
• v. 5
• v. 6
• v. 7
• v. 8
• v. 9
• v. 10
• v. 11
• v. 12
• v. 13
• v. 14

注記

Includes bibliographies and index

Vol. 11,12,13,14 / edited by T. Mulvey and C.J.R. Sheppard

内容説明・目次

巻冊次

v. 12 ISBN 9780120299126

内容説明

The volumes in this series plot progress and innovation in optical and electron microscopy at a fundamental level. The series also describes relevant applications for microscopic techniques in biology, materials science research and industrial inspection. The book also covers material of interest to those in the field of microscope instrumentation.

目次

• The invention of the electron Fresnal interference biprism, G.Mollenstedt
• electron image plane off-axis holography of atom structures, H.Lichte
• magnetic through-the-lens detection in electron microscopy and spectroscopy, P.Kruit
• advances in voltage contrast detectors in scanning electron microscopes, L.Dubbeldam
• scanning near-field optical microscopy (SNOM), D.W.Phol
• microscopic thermal wave non-destructive testing, J.Hartikuinen et al.

巻冊次

v. 13 ISBN 9780120299133

内容説明

Volumes in this series cover progress and innovation in optical and electron microscopy at a fundamental level aimed at microscopists, and researchers interested in microscope instrumentation and applications rangingfrom biological techniques to materials research and industrial inspection.

目次

Microscopists, applied physicists, metallurgists, materials scientists, electrical and electronic engineers.

巻冊次

v. 14 ISBN 9780120299140

内容説明

Volumes in this series cover progress and innovation in optical and electron microscopy at a fundamental level aimed at microscopists, and researchers interested in microscope instrumentation and applications rangingfrom biological techniques to materials research and industrial inspection.

目次

J-P Adriaanse High-Te Superconductors and Magnetic Electron Lenses. E. Kohen and J.G. Hirschberg, Microspectrofluoremetry. S. Kawata, Optical Computed-Tomography Microscope. Y. Shimizu and H. Takenaka, Microscope Objective Design. Subject Index.

「Nielsen BookData」 より

詳細情報

• NII書誌ID(NCID): BA01486568
• ISBN:
  • 0120299038
  • 0120299046
  • 0120299054
  • 0120299062
  • 0120299070
  • 0120299089
  • 0120299097
  • 0120299100
  • 0120299119
  • 0120299127
  • 0120299135
  • 0120299143
• LCCN: 65025134
• 出版国コード: uk
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: London ; Tokyo
• ページ数/冊数: v.
• 大きさ: 24 cm